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Conference Paper: Textile defect classification using discriminative wavelet frames

TitleTextile defect classification using discriminative wavelet frames
Authors
KeywordsAdaptive Wavelets
Discriminative Training
Minimum Classification Error
Textile Inspection
Wavelet Frames
Issue Date2005
Citation
Icia 2005 - Proceedings Of 2005 International Conference On Information Acquisition, 2005, v. 2005, p. 54-58 How to Cite?
AbstractThe classification of defects is highly demanded for automated inspection of textile products. In this paper, a new method for textile defect classification is proposed by using discriminative wavelet frames. Multiscale texture properties of textile image are characterized by its wavelet frames representation. For a better description of the latent structure of textile image, wavelet frames adapted to textile are generated rather than using standard ones. Based on Discriminative Feature Extraction (DFE) method, the wavelet frames and the back-end classifier are simultaneously designed with the common objective of minimizing classification errors. The proposed method has been evaluated on the classification of 466 defect samples containing eight classes of textile defects, and 434 nondefect samples. In comparison with standard wavelet frames, the designed discriminative wavelet frames has been shown to largely improve the classification performance, where 95.8% classification accuracy was achieved. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158457
References

 

DC FieldValueLanguage
dc.contributor.authorYang, Xen_US
dc.contributor.authorGao, Jen_US
dc.contributor.authorPang, Gen_US
dc.contributor.authorYung, Nen_US
dc.date.accessioned2012-08-08T08:59:43Z-
dc.date.available2012-08-08T08:59:43Z-
dc.date.issued2005en_US
dc.identifier.citationIcia 2005 - Proceedings Of 2005 International Conference On Information Acquisition, 2005, v. 2005, p. 54-58en_US
dc.identifier.urihttp://hdl.handle.net/10722/158457-
dc.description.abstractThe classification of defects is highly demanded for automated inspection of textile products. In this paper, a new method for textile defect classification is proposed by using discriminative wavelet frames. Multiscale texture properties of textile image are characterized by its wavelet frames representation. For a better description of the latent structure of textile image, wavelet frames adapted to textile are generated rather than using standard ones. Based on Discriminative Feature Extraction (DFE) method, the wavelet frames and the back-end classifier are simultaneously designed with the common objective of minimizing classification errors. The proposed method has been evaluated on the classification of 466 defect samples containing eight classes of textile defects, and 434 nondefect samples. In comparison with standard wavelet frames, the designed discriminative wavelet frames has been shown to largely improve the classification performance, where 95.8% classification accuracy was achieved. © 2005 IEEE.en_US
dc.languageengen_US
dc.relation.ispartofICIA 2005 - Proceedings of 2005 International Conference on Information Acquisitionen_US
dc.subjectAdaptive Waveletsen_US
dc.subjectDiscriminative Trainingen_US
dc.subjectMinimum Classification Erroren_US
dc.subjectTextile Inspectionen_US
dc.subjectWavelet Framesen_US
dc.titleTextile defect classification using discriminative wavelet framesen_US
dc.typeConference_Paperen_US
dc.identifier.emailPang, G:gpang@eee.hku.hken_US
dc.identifier.emailYung, N:nyung@eee.hku.hken_US
dc.identifier.authorityPang, G=rp00162en_US
dc.identifier.authorityYung, N=rp00226en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-33947152463en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33947152463&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume2005en_US
dc.identifier.spage54en_US
dc.identifier.epage58en_US
dc.identifier.scopusauthoridYang, X=7406505132en_US
dc.identifier.scopusauthoridGao, J=34770858000en_US
dc.identifier.scopusauthoridPang, G=7103393283en_US
dc.identifier.scopusauthoridYung, N=7003473369en_US

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