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Conference Paper: The general variational formulas for capacitance parameter extraction

TitleThe general variational formulas for capacitance parameter extraction
Authors
Chew, WCJiangt, LJ
Issue Date2005
Citation
Ieee Topical Meeting On Electrical Performance Of Electronic Packaging, 2005, v. 2005, p. 281-284 How to Cite?
DOI: http://dx.doi.org/10.1109/EPEP.2005.1563759
AbstractTo obtain second order accuracy using the first order data for the capacitance parameter extraction, a set of new generalized variational formulas are presented in this paper. They are complete since they are valid not only for self-capacitances, but also for mutual capacitances. A more general variational formula is derived to account for the asymmetrical elastance matrix case. By these novel formulas the computational accuracy can be significantly improved compared to the conventional direct capacitance extraction method. © 2005 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/158450
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorChew, WCen_HK
dc.contributor.authorJiangt, LJen_HK
dc.date.accessioned2012-08-08T08:59:41Z-
dc.date.available2012-08-08T08:59:41Z-
dc.date.issued2005en_HK
dc.identifier.citationIeee Topical Meeting On Electrical Performance Of Electronic Packaging, 2005, v. 2005, p. 281-284en_US
dc.identifier.urihttp://hdl.handle.net/10722/158450-
dc.description.abstractTo obtain second order accuracy using the first order data for the capacitance parameter extraction, a set of new generalized variational formulas are presented in this paper. They are complete since they are valid not only for self-capacitances, but also for mutual capacitances. A more general variational formula is derived to account for the asymmetrical elastance matrix case. By these novel formulas the computational accuracy can be significantly improved compared to the conventional direct capacitance extraction method. © 2005 IEEE.en_HK
dc.languageengen_US
dc.relation.ispartofIEEE Topical Meeting on Electrical Performance of Electronic Packagingen_HK
dc.titleThe general variational formulas for capacitance parameter extractionen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChew, WC: wcchew@hku.hken_HK
dc.identifier.emailJiangt, LJ: jianglj@hku.hken_HK
dc.identifier.authorityChew, WC=rp00656en_HK
dc.identifier.authorityJiangt, LJ=rp01338en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/EPEP.2005.1563759en_HK
dc.identifier.scopuseid_2-s2.0-33845907106en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33845907106&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume2005en_HK
dc.identifier.spage281en_HK
dc.identifier.epage284en_HK
dc.identifier.scopusauthoridChew, WC=36014436300en_HK
dc.identifier.scopusauthoridJiangt, LJ=36077777200en_HK

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