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Conference Paper: Exploiting test resource optimization in data path synthesis for BIST

TitleExploiting test resource optimization in data path synthesis for BIST
Authors
Issue Date1999
Citation
Proceedings Of The Ieee Great Lakes Symposium On Vlsi, 1999, p. 342-343 How to Cite?
AbstractArea and test time are two major overheads encountered during data path synthesis for BIST. This paper presents an attempt towards testability enhancement in data path BIST synthesis by considering two factors simultaneously. It is achieved by incorporating two testability constraints in data path synthesis. Experimental results are presented to demonstrate the effectiveness of the proposed (data path) BIST synthesis approach.
Persistent Identifierhttp://hdl.handle.net/10722/158273
ISSN

 

DC FieldValueLanguage
dc.contributor.authorLi, Xiaoweien_US
dc.contributor.authorCheung, Paul YSen_US
dc.date.accessioned2012-08-08T08:58:50Z-
dc.date.available2012-08-08T08:58:50Z-
dc.date.issued1999en_US
dc.identifier.citationProceedings Of The Ieee Great Lakes Symposium On Vlsi, 1999, p. 342-343en_US
dc.identifier.issn1066-1395en_US
dc.identifier.urihttp://hdl.handle.net/10722/158273-
dc.description.abstractArea and test time are two major overheads encountered during data path synthesis for BIST. This paper presents an attempt towards testability enhancement in data path BIST synthesis by considering two factors simultaneously. It is achieved by incorporating two testability constraints in data path synthesis. Experimental results are presented to demonstrate the effectiveness of the proposed (data path) BIST synthesis approach.en_US
dc.languageengen_US
dc.relation.ispartofProceedings of the IEEE Great Lakes Symposium on VLSIen_US
dc.titleExploiting test resource optimization in data path synthesis for BISTen_US
dc.typeConference_Paperen_US
dc.identifier.emailCheung, Paul YS:paul.cheung@hku.hken_US
dc.identifier.authorityCheung, Paul YS=rp00077en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0033334728en_US
dc.identifier.spage342en_US
dc.identifier.epage343en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridLi, Xiaowei=8228906100en_US
dc.identifier.scopusauthoridCheung, Paul YS=7202595335en_US

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