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Conference Paper: Exploiting BIST approach for two-pattern testing

TitleExploiting BIST approach for two-pattern testing
Authors
Issue Date1998
Citation
Proceedings Of The Asian Test Symposium, 1998, p. 424-429 How to Cite?
AbstractDetection of delay and transistor stuck-open faults requires two-pattern tests. BIST provides a low-cost test solution. This paper exploits BIST approach for two-pattern testing. The generation of pseudo-deterministic test-pair sequence with LFSR was exploited. A three-step approach is proposed. First, a set of deterministic test-pair is generated to detect all robust path delay faults. Second, LFSR-based TPG configurations is calculated to have pre-generated test-pair embedded in a set of maximal length pseudo-random test sequences. Third, a global cost-optimal BIST solution for data path (using pseudo-deterministic TPGs) is proposed. The second step is formulated as a cluster-covering problem. The third step is formulated as an 0-1 ILP. Experimental results are presented to demonstrate the effectiveness of the proposed approach.
Persistent Identifierhttp://hdl.handle.net/10722/158255
ISSN

 

DC FieldValueLanguage
dc.contributor.authorLi, Xiaoweien_US
dc.contributor.authorCheung, Paul YSen_US
dc.date.accessioned2012-08-08T08:58:45Z-
dc.date.available2012-08-08T08:58:45Z-
dc.date.issued1998en_US
dc.identifier.citationProceedings Of The Asian Test Symposium, 1998, p. 424-429en_US
dc.identifier.issn1081-7735en_US
dc.identifier.urihttp://hdl.handle.net/10722/158255-
dc.description.abstractDetection of delay and transistor stuck-open faults requires two-pattern tests. BIST provides a low-cost test solution. This paper exploits BIST approach for two-pattern testing. The generation of pseudo-deterministic test-pair sequence with LFSR was exploited. A three-step approach is proposed. First, a set of deterministic test-pair is generated to detect all robust path delay faults. Second, LFSR-based TPG configurations is calculated to have pre-generated test-pair embedded in a set of maximal length pseudo-random test sequences. Third, a global cost-optimal BIST solution for data path (using pseudo-deterministic TPGs) is proposed. The second step is formulated as a cluster-covering problem. The third step is formulated as an 0-1 ILP. Experimental results are presented to demonstrate the effectiveness of the proposed approach.en_US
dc.languageengen_US
dc.relation.ispartofProceedings of the Asian Test Symposiumen_US
dc.titleExploiting BIST approach for two-pattern testingen_US
dc.typeConference_Paperen_US
dc.identifier.emailCheung, Paul YS:paul.cheung@hku.hken_US
dc.identifier.authorityCheung, Paul YS=rp00077en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0032303882en_US
dc.identifier.spage424en_US
dc.identifier.epage429en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridLi, Xiaowei=8228906100en_US
dc.identifier.scopusauthoridCheung, Paul YS=7202595335en_US

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