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Article: Thermal wave interference as the origin of the overshooting phenomenon in dual-phase-lagging heat conduction

TitleThermal wave interference as the origin of the overshooting phenomenon in dual-phase-lagging heat conduction
Authors
KeywordsDual-Phase-Lagging Heat Conduction
Gold Film
Overshooting Phenomenon
Thermal Wave
Issue Date2011
PublisherElsevier France, Editions Scientifiques et Medicales. The Journal's web site is located at http://www.elsevier.com/locate/ijts
Citation
International Journal Of Thermal Sciences, 2011, v. 50 n. 5, p. 825-830 How to Cite?
AbstractIn the present work, the overshooting phenomenon is investigated based on the one-dimensional dual-phase-lagging heat conduction model. The thermal wave interference is found to trigger the overshooting of temperature field. A condition for the occurrence of overshooting phenomenon is established for the one-dimensional dual-phase-lagging heat conduction in a finite medium. According to this condition, the overshooting phenomenon may occur in heat conduction across gold films with the thickness ranging from 4.8555 nm to 19.581 μm. © 2011 Elsevier Masson SAS. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/157105
ISSN
2015 Impact Factor: 2.769
2015 SCImago Journal Rankings: 1.665
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorXu, Men_US
dc.contributor.authorGuo, Jen_US
dc.contributor.authorWang, Len_US
dc.contributor.authorCheng, Len_US
dc.date.accessioned2012-08-08T08:45:21Z-
dc.date.available2012-08-08T08:45:21Z-
dc.date.issued2011en_US
dc.identifier.citationInternational Journal Of Thermal Sciences, 2011, v. 50 n. 5, p. 825-830en_US
dc.identifier.issn1290-0729en_US
dc.identifier.urihttp://hdl.handle.net/10722/157105-
dc.description.abstractIn the present work, the overshooting phenomenon is investigated based on the one-dimensional dual-phase-lagging heat conduction model. The thermal wave interference is found to trigger the overshooting of temperature field. A condition for the occurrence of overshooting phenomenon is established for the one-dimensional dual-phase-lagging heat conduction in a finite medium. According to this condition, the overshooting phenomenon may occur in heat conduction across gold films with the thickness ranging from 4.8555 nm to 19.581 μm. © 2011 Elsevier Masson SAS. All rights reserved.en_US
dc.languageengen_US
dc.publisherElsevier France, Editions Scientifiques et Medicales. The Journal's web site is located at http://www.elsevier.com/locate/ijtsen_US
dc.relation.ispartofInternational Journal of Thermal Sciencesen_US
dc.subjectDual-Phase-Lagging Heat Conductionen_US
dc.subjectGold Filmen_US
dc.subjectOvershooting Phenomenonen_US
dc.subjectThermal Waveen_US
dc.titleThermal wave interference as the origin of the overshooting phenomenon in dual-phase-lagging heat conductionen_US
dc.typeArticleen_US
dc.identifier.emailWang, L:lqwang@hkucc.hku.hken_US
dc.identifier.authorityWang, L=rp00184en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/j.ijthermalsci.2010.12.006en_US
dc.identifier.scopuseid_2-s2.0-79952008833en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79952008833&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume50en_US
dc.identifier.issue5en_US
dc.identifier.spage825en_US
dc.identifier.epage830en_US
dc.identifier.isiWOS:000288823700018-
dc.publisher.placeFranceen_US
dc.identifier.scopusauthoridXu, M=7403607587en_US
dc.identifier.scopusauthoridGuo, J=7404489581en_US
dc.identifier.scopusauthoridWang, L=35235288500en_US
dc.identifier.scopusauthoridCheng, L=25644430300en_US
dc.identifier.citeulike8754856-

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