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Article: Temperature mapping and thermal lensing in large-mode, high-power laser diodes

TitleTemperature mapping and thermal lensing in large-mode, high-power laser diodes
Authors
Issue Date2006
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2006, v. 89 n. 20 How to Cite?
AbstractThe authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ=1.55 μm InGaAsPInP watt-class laser that has a large (>5×5 μ m2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices. © 2006 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/156861
ISSN
2015 Impact Factor: 3.142
2015 SCImago Journal Rankings: 1.105
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorChan, PKLen_US
dc.contributor.authorPipe, KPen_US
dc.contributor.authorPlant, JJen_US
dc.contributor.authorSwint, RBen_US
dc.contributor.authorJuodawlkis, PWen_US
dc.date.accessioned2012-08-08T08:44:19Z-
dc.date.available2012-08-08T08:44:19Z-
dc.date.issued2006en_US
dc.identifier.citationApplied Physics Letters, 2006, v. 89 n. 20en_US
dc.identifier.issn0003-6951en_US
dc.identifier.urihttp://hdl.handle.net/10722/156861-
dc.description.abstractThe authors use high-resolution charge-coupled device based thermoreflectance to derive two dimensional facet temperature maps of a λ=1.55 μm InGaAsPInP watt-class laser that has a large (>5×5 μ m2) fundamental optical mode. Recognizing that temperature rise in the laser will lead to refractive index increase, they use the measured temperature profiles as an input to a finite-element mode solver, predicting bias-dependent spatial mode behavior that agrees well with experimental observations. These results demonstrate the general usefulness of high-resolution thermal imaging for studying spatial mode dynamics in photonic devices. © 2006 American Institute of Physics.en_US
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_US
dc.relation.ispartofApplied Physics Lettersen_US
dc.titleTemperature mapping and thermal lensing in large-mode, high-power laser diodesen_US
dc.typeArticleen_US
dc.identifier.emailChan, PKL:pklc@hku.hken_US
dc.identifier.authorityChan, PKL=rp01532en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1063/1.2388884en_US
dc.identifier.scopuseid_2-s2.0-33751101574en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33751101574&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume89en_US
dc.identifier.issue20en_US
dc.identifier.isiWOS:000242100200010-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridChan, PKL=35742829700en_US
dc.identifier.scopusauthoridPipe, KP=6603768450en_US
dc.identifier.scopusauthoridPlant, JJ=7103190594en_US
dc.identifier.scopusauthoridSwint, RB=6603698023en_US
dc.identifier.scopusauthoridJuodawlkis, PW=6603752090en_US

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