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Article: X-ray photoelectron spectroscopy analysis of ion beam sputter deposited calcium phosphate coating

TitleX-ray photoelectron spectroscopy analysis of ion beam sputter deposited calcium phosphate coating
Authors
Issue Date2001
Citation
Journal Of Materials Science Letters, 2001, v. 20 n. 14, p. 1277-1279 How to Cite?
AbstractX-ray photoelectron spectroscopy was used to analyze the ion beam sputter deposited calcium phosphate coating. Pure titanium plates of the size 20mm × 20mm × 1mm were used as the substrtate. They were polished and ultrasonically cleaned with acetone. Hydroxyapatite (HA) powder was synthesized using the wet method. HA powder disks used to analyze the ion beam sputtering target were cold pressed and sintered at 1150° C for 3 h. It was found that ion beam sputter deposition system mainly consisted of one Kaufman ion source and one Freeman ion source.
Persistent Identifierhttp://hdl.handle.net/10722/156615
ISSN
2005 Impact Factor: 0.711
2006 SCImago Journal Rankings: 0.443
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorWang, CXen_US
dc.contributor.authorChen, ZQen_US
dc.contributor.authorWang, Men_US
dc.date.accessioned2012-08-08T08:43:12Z-
dc.date.available2012-08-08T08:43:12Z-
dc.date.issued2001en_US
dc.identifier.citationJournal Of Materials Science Letters, 2001, v. 20 n. 14, p. 1277-1279en_US
dc.identifier.issn0261-8028en_US
dc.identifier.urihttp://hdl.handle.net/10722/156615-
dc.description.abstractX-ray photoelectron spectroscopy was used to analyze the ion beam sputter deposited calcium phosphate coating. Pure titanium plates of the size 20mm × 20mm × 1mm were used as the substrtate. They were polished and ultrasonically cleaned with acetone. Hydroxyapatite (HA) powder was synthesized using the wet method. HA powder disks used to analyze the ion beam sputtering target were cold pressed and sintered at 1150° C for 3 h. It was found that ion beam sputter deposition system mainly consisted of one Kaufman ion source and one Freeman ion source.en_US
dc.languageengen_US
dc.relation.ispartofJournal of Materials Science Lettersen_US
dc.titleX-ray photoelectron spectroscopy analysis of ion beam sputter deposited calcium phosphate coatingen_US
dc.typeArticleen_US
dc.identifier.emailWang, M:memwang@hku.hken_US
dc.identifier.authorityWang, M=rp00185en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1023/A:1010925812502en_US
dc.identifier.scopuseid_2-s2.0-0035874671en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0035874671&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume20en_US
dc.identifier.issue14en_US
dc.identifier.spage1277en_US
dc.identifier.epage1279en_US
dc.identifier.isiWOS:000170285900002-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridWang, CX=15735379100en_US
dc.identifier.scopusauthoridChen, ZQ=35326244300en_US
dc.identifier.scopusauthoridWang, M=15749714100en_US

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