Article: Genetic algorithm based defect identification system
| Title | Genetic algorithm based defect identification system |
|---|---|
| Authors | Tam, SM1 Cheung, KC1 |
| Issue Date | 2000 |
| Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/eswa |
| Citation | Expert Systems With Applications, 2000, v. 18 n. 1, p. 17-25 [How to Cite?] DOI: http://dx.doi.org/10.1016/S0957-4174(99)00046-9 |
| Abstract | A genetic algorithm based defect identification system for machined-parts inspection purposes is developed. It can identify defects from the mass and coordinates of center of mass of a defective part. This method uses genetic algorithm search to find combinations of dimensions that produce the same mass and coordinates of center of mass as the defective part. There is also a knowledge base to store defects that have been identified previously. |
| ISSN | 0957-4174 2011 Impact Factor: 2.203 2011 SCImago Journal Rankings: 0.070 |
| DOI | http://dx.doi.org/10.1016/S0957-4174(99)00046-9 |
| ISI Accession Number ID | WOS:000084945500002 |
| References | References in Scopus |
| dc.contributor.author | Tam, SM |
|---|---|
| dc.contributor.author | Cheung, KC |
| dc.date.accessioned | 2012-08-08T08:42:51Z |
| dc.date.available | 2012-08-08T08:42:51Z |
| dc.date.issued | 2000 |
| dc.description.abstract | A genetic algorithm based defect identification system for machined-parts inspection purposes is developed. It can identify defects from the mass and coordinates of center of mass of a defective part. This method uses genetic algorithm search to find combinations of dimensions that produce the same mass and coordinates of center of mass as the defective part. There is also a knowledge base to store defects that have been identified previously. |
| dc.description.nature | Link_to_subscribed_fulltext |
| dc.identifier.citation | Expert Systems With Applications, 2000, v. 18 n. 1, p. 17-25 [How to Cite?] DOI: http://dx.doi.org/10.1016/S0957-4174(99)00046-9 |
| dc.identifier.doi | http://dx.doi.org/10.1016/S0957-4174(99)00046-9 |
| dc.identifier.epage | 25 |
| dc.identifier.isi | WOS:000084945500002 |
| dc.identifier.issn | 0957-4174 2011 Impact Factor: 2.203 2011 SCImago Journal Rankings: 0.070 |
| dc.identifier.issue | 1 |
| dc.identifier.scopus | eid_2-s2.0-0033689774 |
| dc.identifier.spage | 17 |
| dc.identifier.uri | http://hdl.handle.net/10722/156537 |
| dc.identifier.volume | 18 |
| dc.language | eng |
| dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/eswa |
| dc.publisher.place | United Kingdom |
| dc.relation.ispartof | Expert Systems with Applications |
| dc.relation.references | References in Scopus |
| dc.title | Genetic algorithm based defect identification system |
| dc.type | Article |
Author Affiliations
- The University of Hong Kong