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Article: An improved photo-elastic technique for determining the mixed-mode stress-intensity factors for interfacial cracks in a bi-material
Title | An improved photo-elastic technique for determining the mixed-mode stress-intensity factors for interfacial cracks in a bi-material |
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Authors | |
Keywords | Bi-Material Complex Potentials Interfacial Cracks Least Square Method Photo-Elastic Technique Stress Intensity Factors |
Issue Date | 1999 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/compscitech |
Citation | Composites Science And Technology, 1999, v. 59 n. 7, p. 1033-1039 How to Cite? |
Abstract | Attempts to employ the photo-elastic technique to determine the complex stress-intensity factors of interfacial cracks in a bi-material reveal the weakness of the technique. This weakness is due to the large errors arising from the measurement of the coordinates of data points and fringe orders near the crack tip. In this paper, an improved photo-elastic approach is proposed to reduce the effects of the measurement errors. The results obtained by this modified method are compared with both a traditional photo-elastic solution and a theoretical solution derived from complex potentials. The comparison shows that the modified solution is in better agreement with the theoretical solution as compared with the traditional solution. |
Persistent Identifier | http://hdl.handle.net/10722/156505 |
ISSN | 2023 Impact Factor: 8.3 2023 SCImago Journal Rankings: 1.800 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Soh, AK | en_US |
dc.date.accessioned | 2012-08-08T08:42:43Z | - |
dc.date.available | 2012-08-08T08:42:43Z | - |
dc.date.issued | 1999 | en_US |
dc.identifier.citation | Composites Science And Technology, 1999, v. 59 n. 7, p. 1033-1039 | en_US |
dc.identifier.issn | 0266-3538 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/156505 | - |
dc.description.abstract | Attempts to employ the photo-elastic technique to determine the complex stress-intensity factors of interfacial cracks in a bi-material reveal the weakness of the technique. This weakness is due to the large errors arising from the measurement of the coordinates of data points and fringe orders near the crack tip. In this paper, an improved photo-elastic approach is proposed to reduce the effects of the measurement errors. The results obtained by this modified method are compared with both a traditional photo-elastic solution and a theoretical solution derived from complex potentials. The comparison shows that the modified solution is in better agreement with the theoretical solution as compared with the traditional solution. | en_US |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/compscitech | en_US |
dc.relation.ispartof | Composites Science and Technology | en_US |
dc.subject | Bi-Material | en_US |
dc.subject | Complex Potentials | en_US |
dc.subject | Interfacial Cracks | en_US |
dc.subject | Least Square Method | en_US |
dc.subject | Photo-Elastic Technique | en_US |
dc.subject | Stress Intensity Factors | en_US |
dc.title | An improved photo-elastic technique for determining the mixed-mode stress-intensity factors for interfacial cracks in a bi-material | en_US |
dc.type | Article | en_US |
dc.identifier.email | Soh, AK:aksoh@hkucc.hku.hk | en_US |
dc.identifier.authority | Soh, AK=rp00170 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1016/S0266-3538(98)00142-0 | - |
dc.identifier.scopus | eid_2-s2.0-0032678591 | en_US |
dc.identifier.hkuros | 41063 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0032678591&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 59 | en_US |
dc.identifier.issue | 7 | en_US |
dc.identifier.spage | 1033 | en_US |
dc.identifier.epage | 1039 | en_US |
dc.identifier.isi | WOS:000080509200006 | - |
dc.publisher.place | United Kingdom | en_US |
dc.identifier.scopusauthorid | Soh, AK=7006795203 | en_US |
dc.identifier.issnl | 0266-3538 | - |