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Article: A new noncontact method for the prediction of both internal thermal resistance and junction temperature of white light-emitting diodes
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TitleA new noncontact method for the prediction of both internal thermal resistance and junction temperature of white light-emitting diodes
 
AuthorsTao, X2
Chen, H1
Li, SN1
Hui, SYR1 3
 
KeywordsLight-Emitting Diodes (LED) System Theory
Lighting
 
Issue Date2012
 
PublisherIEEE
 
CitationIEEE Transactions on Power Electronics, 2012, v. 27 n. 4, p. 2184-2192 [How to Cite?]
DOI: http://dx.doi.org/10.1109/TPEL.2011.2169461
 
AbstractAlthough critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. Based on the general photoelectrothermal theory for LED systems, the coefficient for the reduction of luminous efficacy with junction temperature is first related to the characteristic temperature of the LED. Then, a noncontact method for estimating the internal junction temperature T j and junction-case thermal resistance R jc of LED from the external power and luminous flux measurements is presented and verified practically. Since these external measurements can be obtained easily, the proposal provides a simple tool for checking T j in new LED system designs without using expensive or sophisticated thermal monitoring equipment for the LED junctions. The proposed method has been checked with measurements on LED devices from three different brands with both constant and nonconstant R jc. The theoretical predictions are found to be highly consistent with practical measurements. © 2011 IEEE.
 
ISSN0885-8993
2013 Impact Factor: 5.726
2013 SCImago Journal Rankings: 2.866
 
DOIhttp://dx.doi.org/10.1109/TPEL.2011.2169461
 
ISI Accession Number IDWOS:000300581500048
Funding AgencyGrant Number
Hong Kong Research Grant CouncilHKU-114411
Funding Information:

Manuscript received July 28, 2011; accepted August 29, 2011. Date of current version February 20, 2012. This work was supported by Hong Kong Research Grant Council under Project HKU-114411. Recommended for publication by Associate Editor J. M. Alonso.

 
ReferencesReferences in Scopus
 
DC FieldValue
dc.contributor.authorTao, X
 
dc.contributor.authorChen, H
 
dc.contributor.authorLi, SN
 
dc.contributor.authorHui, SYR
 
dc.date.accessioned2012-08-08T08:35:06Z
 
dc.date.available2012-08-08T08:35:06Z
 
dc.date.issued2012
 
dc.description.abstractAlthough critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. Based on the general photoelectrothermal theory for LED systems, the coefficient for the reduction of luminous efficacy with junction temperature is first related to the characteristic temperature of the LED. Then, a noncontact method for estimating the internal junction temperature T j and junction-case thermal resistance R jc of LED from the external power and luminous flux measurements is presented and verified practically. Since these external measurements can be obtained easily, the proposal provides a simple tool for checking T j in new LED system designs without using expensive or sophisticated thermal monitoring equipment for the LED junctions. The proposed method has been checked with measurements on LED devices from three different brands with both constant and nonconstant R jc. The theoretical predictions are found to be highly consistent with practical measurements. © 2011 IEEE.
 
dc.description.naturepublished_or_final_version
 
dc.identifier.citationIEEE Transactions on Power Electronics, 2012, v. 27 n. 4, p. 2184-2192 [How to Cite?]
DOI: http://dx.doi.org/10.1109/TPEL.2011.2169461
 
dc.identifier.doihttp://dx.doi.org/10.1109/TPEL.2011.2169461
 
dc.identifier.epage2192
 
dc.identifier.hkuros209240
 
dc.identifier.isiWOS:000300581500048
Funding AgencyGrant Number
Hong Kong Research Grant CouncilHKU-114411
Funding Information:

Manuscript received July 28, 2011; accepted August 29, 2011. Date of current version February 20, 2012. This work was supported by Hong Kong Research Grant Council under Project HKU-114411. Recommended for publication by Associate Editor J. M. Alonso.

 
dc.identifier.issn0885-8993
2013 Impact Factor: 5.726
2013 SCImago Journal Rankings: 2.866
 
dc.identifier.issue4
 
dc.identifier.scopuseid_2-s2.0-84863115557
 
dc.identifier.spage2184
 
dc.identifier.urihttp://hdl.handle.net/10722/155738
 
dc.identifier.volume27
 
dc.languageeng
 
dc.publisherIEEE
 
dc.publisher.placeUnited States
 
dc.relation.ispartofIEEE Transactions on Power Electronics
 
dc.relation.referencesReferences in Scopus
 
dc.rightsIEEE Transactions on Power Electronics. Copyright © IEEE.
 
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
 
dc.rights.uri2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
 
dc.subjectLight-Emitting Diodes (LED) System Theory
 
dc.subjectLighting
 
dc.titleA new noncontact method for the prediction of both internal thermal resistance and junction temperature of white light-emitting diodes
 
dc.typeArticle
 
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<contributor.author>Chen, H</contributor.author>
<contributor.author>Li, SN</contributor.author>
<contributor.author>Hui, SYR</contributor.author>
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<description.abstract>Although critical to the lifetime of LED, the junction temperature of LED cannot be measured easily. Based on the general photoelectrothermal theory for LED systems, the coefficient for the reduction of luminous efficacy with junction temperature is first related to the characteristic temperature of the LED. Then, a noncontact method for estimating the internal junction temperature T j and junction-case thermal resistance R jc of LED from the external power and luminous flux measurements is presented and verified practically. Since these external measurements can be obtained easily, the proposal provides a simple tool for checking T j in new LED system designs without using expensive or sophisticated thermal monitoring equipment for the LED junctions. The proposed method has been checked with measurements on LED devices from three different brands with both constant and nonconstant R jc. The theoretical predictions are found to be highly consistent with practical measurements. &#169; 2011 IEEE.</description.abstract>
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<title>A new noncontact method for the prediction of both internal thermal resistance and junction temperature of white light-emitting diodes</title>
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Author Affiliations
  1. The University of Hong Kong
  2. City University of Hong Kong
  3. Imperial College London