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Article: Guest editorial

TitleGuest editorial
Authors
Azcondo, FJAlonso, JMHui, SY
Issue Date2012
PublisherI E E E. The Journal's web site is located at http://www.ewh.ieee.org/soc/ies/ties/index.html
Citation
Ieee Transactions On Industrial Electronics, 2012, v. 59 n. 4, p. 1686-1688 How to Cite?
DOI: http://dx.doi.org/10.1109/TIE.2011.2168081
Persistent Identifierhttp://hdl.handle.net/10722/155686
ISSN
0278-0046
2021 Impact Factor: 8.162
2020 SCImago Journal Rankings: 2.393
ISI Accession Number ID
WOS:000296480700001

 

DC FieldValueLanguage
dc.contributor.authorAzcondo, FJen_US
dc.contributor.authorAlonso, JMen_US
dc.contributor.authorHui, SYen_US
dc.date.accessioned2012-08-08T08:34:49Z-
dc.date.available2012-08-08T08:34:49Z-
dc.date.issued2012en_US
dc.identifier.citationIeee Transactions On Industrial Electronics, 2012, v. 59 n. 4, p. 1686-1688en_US
dc.identifier.issn0278-0046en_US
dc.identifier.urihttp://hdl.handle.net/10722/155686-
dc.languageengen_US
dc.publisherI E E E. The Journal's web site is located at http://www.ewh.ieee.org/soc/ies/ties/index.htmlen_US
dc.relation.ispartofIEEE Transactions on Industrial Electronicsen_US
dc.titleGuest editorialen_US
dc.typeArticleen_US
dc.identifier.emailHui, SY:ronhui@eee.hku.hken_US
dc.identifier.authorityHui, SY=rp01510en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/TIE.2011.2168081en_US
dc.identifier.scopuseid_2-s2.0-80455150059en_US
dc.identifier.volume59en_US
dc.identifier.issue4en_US
dc.identifier.spage1686en_US
dc.identifier.epage1688en_US
dc.identifier.isiWOS:000296480700001-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridAzcondo, FJ=6603627756en_US
dc.identifier.scopusauthoridAlonso, JM=7403482532en_US
dc.identifier.scopusauthoridHui, SY=7202831744en_US
dc.identifier.issnl0278-0046-

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