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Article: Enhanced sensing performance of MISiC schottky-diode hydrogen sensor by using HfON as gate insulator
Title | Enhanced sensing performance of MISiC schottky-diode hydrogen sensor by using HfON as gate insulator | ||||||
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Authors | |||||||
Keywords | Hfo 2 Hydrogen Sensors Nitridation Schottky Diode Silicon Carbide | ||||||
Issue Date | 2011 | ||||||
Publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361 | ||||||
Citation | IEEE Sensors Journal, 2011, v. 11 n. 11, p. 2940-2946 How to Cite? | ||||||
Abstract | MISiC Schottky-diode hydrogen sensor with HfON gate insulator fabricated by NO nitridation is investigated. The hydrogen-sensing characteristics of this novel sensor are studied by doing steady-state and transient measurements at different temperatures and hydrogen concentrations using a computer-controlled measurement system. Experimental results show that this novel sensor can rapidly respond to hydrogen variation and can give a significant response even at a low H 2 concentration of 48-ppm, e.g., a sensitivity of 81% is achieved at 450°C and 2.5 V, which is two times higher than its HfO 2 counterpart. The enhanced sensitivity of the device should be attributed to a remarkable reduction of the current of the sensor before hydrogen exposure by the NO nitridation because the NO nitridation can passivate the O vacancies in the insulator and facilitate the formation of a SiO 2 interlayer to suppress the leakage current associated with high-k materials. © 2006 IEEE. | ||||||
Persistent Identifier | http://hdl.handle.net/10722/155681 | ||||||
ISSN | 2023 Impact Factor: 4.3 2023 SCImago Journal Rankings: 1.084 | ||||||
ISI Accession Number ID |
Funding Information: This work was supported in part by the University Development Fund (Nanotechnology Research Institute, 00600009) of The University of Hong Kong and RGC of HKSAR, China (Project No. HKU 713310E). The associate editor coordinating the review of this paper and approving it for publication was Prof. Bernhard Jakoby. | ||||||
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Tang, WM | en_US |
dc.contributor.author | Leung, CH | en_US |
dc.contributor.author | Lai, PT | en_US |
dc.date.accessioned | 2012-08-08T08:34:48Z | - |
dc.date.available | 2012-08-08T08:34:48Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.citation | IEEE Sensors Journal, 2011, v. 11 n. 11, p. 2940-2946 | en_US |
dc.identifier.issn | 1530-437X | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/155681 | - |
dc.description.abstract | MISiC Schottky-diode hydrogen sensor with HfON gate insulator fabricated by NO nitridation is investigated. The hydrogen-sensing characteristics of this novel sensor are studied by doing steady-state and transient measurements at different temperatures and hydrogen concentrations using a computer-controlled measurement system. Experimental results show that this novel sensor can rapidly respond to hydrogen variation and can give a significant response even at a low H 2 concentration of 48-ppm, e.g., a sensitivity of 81% is achieved at 450°C and 2.5 V, which is two times higher than its HfO 2 counterpart. The enhanced sensitivity of the device should be attributed to a remarkable reduction of the current of the sensor before hydrogen exposure by the NO nitridation because the NO nitridation can passivate the O vacancies in the insulator and facilitate the formation of a SiO 2 interlayer to suppress the leakage current associated with high-k materials. © 2006 IEEE. | en_US |
dc.language | eng | en_US |
dc.publisher | IEEE. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=7361 | - |
dc.relation.ispartof | IEEE Sensors Journal | en_US |
dc.subject | Hfo 2 | en_US |
dc.subject | Hydrogen Sensors | en_US |
dc.subject | Nitridation | en_US |
dc.subject | Schottky Diode | en_US |
dc.subject | Silicon Carbide | en_US |
dc.title | Enhanced sensing performance of MISiC schottky-diode hydrogen sensor by using HfON as gate insulator | en_US |
dc.type | Article | en_US |
dc.identifier.email | Leung, CH:chleung@eee.hku.hk | en_US |
dc.identifier.email | Lai, PT:laip@eee.hku.hk | en_US |
dc.identifier.authority | Leung, CH=rp00146 | en_US |
dc.identifier.authority | Lai, PT=rp00130 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1109/JSEN.2011.2148709 | en_US |
dc.identifier.scopus | eid_2-s2.0-80055044237 | en_US |
dc.identifier.hkuros | 225727 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-80055044237&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 11 | en_US |
dc.identifier.issue | 11 | en_US |
dc.identifier.spage | 2940 | en_US |
dc.identifier.epage | 2946 | en_US |
dc.identifier.isi | WOS:000304164900006 | - |
dc.publisher.place | United States | en_US |
dc.identifier.scopusauthorid | Tang, WM=24438163600 | en_US |
dc.identifier.scopusauthorid | Leung, CH=7402612415 | en_US |
dc.identifier.scopusauthorid | Lai, PT=7202946460 | en_US |
dc.identifier.issnl | 1530-437X | - |