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Article: Pulsed EM field response of a thin, high-contrast, finely layered structure with dielectric and conductive properties

TitlePulsed EM field response of a thin, high-contrast, finely layered structure with dielectric and conductive properties
Authors
KeywordsHigh-Contrast Thin Layers
Pulsed Em Fields
Issue Date2009
Citation
Ieee Transactions On Antennas And Propagation, 2009, v. 57 n. 8, p. 2260-2269 How to Cite?
AbstractThe response of a thin, high-contrast, finely layered structure with dielectric and conductive properties to an incident, pulsed, electromagnetic field is investigated theoretically. The fine layering causes the standard spatial discretization techniques to solve Maxwell's equations numerically to be practically inapplicable. To overcome this difficulty, an approximate method is proposed that models the interaction of the layer with an incident electromagnetic field via a boundary condition that expresses the in-plane conduction and contrast electric polarization currents in terms of the exciting incident field by relating the jump in the tangential component of the magnetic field strength across the layer in terms of the (continuous) tangential component of the electric field strength in the layer. In the pertaining layer admittance coefficient, the integrated values of the conductance and the contrast permittivity profiles across the layer occur. The model is applied to the scattering of an incident plane wave with pulsed time signature by a layer of infinite extent. Expressions for pulse shapes of the scattered field are obtained. In them, the layer properties and the direction of incidence and polarization of the incident wave occur as parameters. Numerical results are presented for reflected and transmitted wave pulse shapes for some parameter values. © 2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/155537
ISSN
2015 Impact Factor: 2.053
2015 SCImago Journal Rankings: 2.130
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorDe Hoop, ATen_US
dc.contributor.authorJiang, Len_US
dc.date.accessioned2012-08-08T08:33:59Z-
dc.date.available2012-08-08T08:33:59Z-
dc.date.issued2009en_US
dc.identifier.citationIeee Transactions On Antennas And Propagation, 2009, v. 57 n. 8, p. 2260-2269en_US
dc.identifier.issn0018-926Xen_US
dc.identifier.urihttp://hdl.handle.net/10722/155537-
dc.description.abstractThe response of a thin, high-contrast, finely layered structure with dielectric and conductive properties to an incident, pulsed, electromagnetic field is investigated theoretically. The fine layering causes the standard spatial discretization techniques to solve Maxwell's equations numerically to be practically inapplicable. To overcome this difficulty, an approximate method is proposed that models the interaction of the layer with an incident electromagnetic field via a boundary condition that expresses the in-plane conduction and contrast electric polarization currents in terms of the exciting incident field by relating the jump in the tangential component of the magnetic field strength across the layer in terms of the (continuous) tangential component of the electric field strength in the layer. In the pertaining layer admittance coefficient, the integrated values of the conductance and the contrast permittivity profiles across the layer occur. The model is applied to the scattering of an incident plane wave with pulsed time signature by a layer of infinite extent. Expressions for pulse shapes of the scattered field are obtained. In them, the layer properties and the direction of incidence and polarization of the incident wave occur as parameters. Numerical results are presented for reflected and transmitted wave pulse shapes for some parameter values. © 2009 IEEE.en_US
dc.languageengen_US
dc.relation.ispartofIEEE Transactions on Antennas and Propagationen_US
dc.subjectHigh-Contrast Thin Layersen_US
dc.subjectPulsed Em Fieldsen_US
dc.titlePulsed EM field response of a thin, high-contrast, finely layered structure with dielectric and conductive propertiesen_US
dc.typeArticleen_US
dc.identifier.emailJiang, L:ljiang@eee.hku.hken_US
dc.identifier.authorityJiang, L=rp01338en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/TAP.2009.2021877en_US
dc.identifier.scopuseid_2-s2.0-68949198888en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-68949198888&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume57en_US
dc.identifier.issue8en_US
dc.identifier.spage2260en_US
dc.identifier.epage2269en_US
dc.identifier.isiWOS:000268756100004-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridde Hoop, AT=7005243861en_US
dc.identifier.scopusauthoridJiang, L=36077777200en_US

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