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Article: Measurement and modeling of thermal effects on magnetic hysteresis of soft ferrites

TitleMeasurement and modeling of thermal effects on magnetic hysteresis of soft ferrites
Authors
KeywordsMagnetic Hysteresis Measurement
Magnetic Hysteresis Modeling
Soft Ferrites
Thermal Effects
Issue Date2007
PublisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20
Citation
Ieee Transactions On Magnetics, 2007, v. 43 n. 11, p. 3952-3960 How to Cite?
AbstractWe present experimental measurement of thermal effects on magnetic hysteresis of soft ferrite cores commonly used in high-frequency inductors and transformers and propose a method to model the thermal effects. We measured the major hysteresis loops of soft ferrite core samples from various vendors at different temperatures, and found that the saturation points of the limiting hysteresis loops vary with the temperature substantially in a nonlinear manner, but within the normal operating temperature range, typically 20degC-100degC, this variation can be approximately regarded as linear with an acceptable error. We propose a simple method based on this approximation for determining the limiting hysteresis loop of a soft ferrite for a given temperature. This method is validated by the substantial agreement between the experimental measurement and simulation by the scalar Preisach hysteresis model of major hysteresis loops of the test samples at different temperatures. Since most manufacturers provide the limiting loops of their soft ferrite cores at two typical temperatures, the proposed method is very convenient for engineering applications. © 2007 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/155505
ISSN
2015 Impact Factor: 1.277
2015 SCImago Journal Rankings: 0.602
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLu, HYen_US
dc.contributor.authorZhu, JGen_US
dc.contributor.authorHui, SYRen_US
dc.date.accessioned2012-08-08T08:33:49Z-
dc.date.available2012-08-08T08:33:49Z-
dc.date.issued2007en_US
dc.identifier.citationIeee Transactions On Magnetics, 2007, v. 43 n. 11, p. 3952-3960en_US
dc.identifier.issn0018-9464en_US
dc.identifier.urihttp://hdl.handle.net/10722/155505-
dc.description.abstractWe present experimental measurement of thermal effects on magnetic hysteresis of soft ferrite cores commonly used in high-frequency inductors and transformers and propose a method to model the thermal effects. We measured the major hysteresis loops of soft ferrite core samples from various vendors at different temperatures, and found that the saturation points of the limiting hysteresis loops vary with the temperature substantially in a nonlinear manner, but within the normal operating temperature range, typically 20degC-100degC, this variation can be approximately regarded as linear with an acceptable error. We propose a simple method based on this approximation for determining the limiting hysteresis loop of a soft ferrite for a given temperature. This method is validated by the substantial agreement between the experimental measurement and simulation by the scalar Preisach hysteresis model of major hysteresis loops of the test samples at different temperatures. Since most manufacturers provide the limiting loops of their soft ferrite cores at two typical temperatures, the proposed method is very convenient for engineering applications. © 2007 IEEE.en_US
dc.languageengen_US
dc.publisherI E E E. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=20en_US
dc.relation.ispartofIEEE Transactions on Magneticsen_US
dc.subjectMagnetic Hysteresis Measurementen_US
dc.subjectMagnetic Hysteresis Modelingen_US
dc.subjectSoft Ferritesen_US
dc.subjectThermal Effectsen_US
dc.titleMeasurement and modeling of thermal effects on magnetic hysteresis of soft ferritesen_US
dc.typeArticleen_US
dc.identifier.emailHui, SYR:ronhui@eee.hku.hken_US
dc.identifier.authorityHui, SYR=rp01510en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/TMAG.2007.904942en_US
dc.identifier.scopuseid_2-s2.0-59249106575en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-59249106575&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume43en_US
dc.identifier.issue11en_US
dc.identifier.spage3952en_US
dc.identifier.epage3960en_US
dc.identifier.isiWOS:000250446600003-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridLu, HY=7404842588en_US
dc.identifier.scopusauthoridZhu, JG=8095781900en_US
dc.identifier.scopusauthoridHui, SYR=7202831744en_US

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