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Article: Metal-insulator-metal transistors
Title | Metal-insulator-metal transistors |
---|---|
Authors | |
Issue Date | 2008 |
Citation | Advanced Materials, 2008, v. 20 n. 11, p. 2120-2124 How to Cite? |
Abstract | A method to prepare metal-insulator-metal field-effect transistor (TFTs) is reported. The study fabricated a substrate-gate structure thin-film transistor by growing an oxide SiO 2 layer on a doped n-type Si substrates. The study also used a source and drain electrodes with a monolayer/multilayer films for thermal evaporation. A scanning electron microscopy (SEM) was used during the study to analyze the electrode-only structures. It was observed during the study that the reduction of the density of states can increase the relative field effects. The study also found that a channel can be prepared by the same material as the source and drain contacts for a metal TFT, that can reduce the cost of production of TFTs. It was also observed that the metal TFT has an infinite on-off ratio. |
Persistent Identifier | http://hdl.handle.net/10722/155496 |
ISSN | 2023 Impact Factor: 27.4 2023 SCImago Journal Rankings: 9.191 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Stallinga, P | en_HK |
dc.contributor.author | Roy, VAL | en_HK |
dc.contributor.author | Xu, ZX | en_HK |
dc.contributor.author | Xiang, HF | en_HK |
dc.contributor.author | Che, CM | en_HK |
dc.date.accessioned | 2012-08-08T08:33:47Z | - |
dc.date.available | 2012-08-08T08:33:47Z | - |
dc.date.issued | 2008 | en_HK |
dc.identifier.citation | Advanced Materials, 2008, v. 20 n. 11, p. 2120-2124 | en_HK |
dc.identifier.issn | 0935-9648 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/155496 | - |
dc.description.abstract | A method to prepare metal-insulator-metal field-effect transistor (TFTs) is reported. The study fabricated a substrate-gate structure thin-film transistor by growing an oxide SiO 2 layer on a doped n-type Si substrates. The study also used a source and drain electrodes with a monolayer/multilayer films for thermal evaporation. A scanning electron microscopy (SEM) was used during the study to analyze the electrode-only structures. It was observed during the study that the reduction of the density of states can increase the relative field effects. The study also found that a channel can be prepared by the same material as the source and drain contacts for a metal TFT, that can reduce the cost of production of TFTs. It was also observed that the metal TFT has an infinite on-off ratio. | en_HK |
dc.language | eng | en_US |
dc.relation.ispartof | Advanced Materials | en_HK |
dc.title | Metal-insulator-metal transistors | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Xiang, HF:hfxiang@eee.hku.hk | en_HK |
dc.identifier.email | Che, CM:cmche@hku.hk | en_HK |
dc.identifier.authority | Xiang, HF=rp00196 | en_HK |
dc.identifier.authority | Che, CM=rp00670 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1002/adma.200702525 | en_HK |
dc.identifier.scopus | eid_2-s2.0-55049119053 | en_HK |
dc.identifier.hkuros | 144103 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-55049119053&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 20 | en_HK |
dc.identifier.issue | 11 | en_HK |
dc.identifier.spage | 2120 | en_HK |
dc.identifier.epage | 2124 | en_HK |
dc.identifier.isi | WOS:000257044600017 | - |
dc.publisher.place | Germany | en_HK |
dc.identifier.scopusauthorid | Stallinga, P=6701332987 | en_HK |
dc.identifier.scopusauthorid | Roy, VAL=7005870324 | en_HK |
dc.identifier.scopusauthorid | Xu, ZX=8726524500 | en_HK |
dc.identifier.scopusauthorid | Xiang, HF=23065758900 | en_HK |
dc.identifier.scopusauthorid | Che, CM=7102442791 | en_HK |
dc.identifier.issnl | 0935-9648 | - |