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Article: AlGaAs/GaAs heterojunction bipolar transistor with a two-dimensional electron gas emitter
Title | AlGaAs/GaAs heterojunction bipolar transistor with a two-dimensional electron gas emitter |
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Authors | |
Issue Date | 1991 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 1991, v. 59 n. 20, p. 2582-2584 How to Cite? |
Abstract | We report the operation of the first two-dimensional electron gas (2-DEG) emitter heterojunction bipolar transistor. This device, which was grown by molecular beam epitaxy, incorporates an undoped GaAs spacer between the emitter and base of a standard AlGaAs/GaAs single-heterojunction bipolar transistor. The introduction of the spacer layer causes the formation of a 2-DEG at the AlGaAs/GaAs interface. This 2-DEG defines the emitter side of the junction and produces an emitter-base characteristic similar to that of the collector GaAs homojunction. Using a 300 Å GaAs spacer, offset voltages as low as 30 mV have been attained. These devices also exhibit current gains greater than 10 at emitter current densities of 3 A/cm2 and gains up to 400 in the high current density regime. |
Persistent Identifier | http://hdl.handle.net/10722/155400 |
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Wang, Q | en_US |
dc.contributor.author | Wang, Y | en_US |
dc.contributor.author | Longenbach, KF | en_US |
dc.contributor.author | Yang, ES | en_US |
dc.contributor.author | Wang, WI | en_US |
dc.date.accessioned | 2012-08-08T08:33:18Z | - |
dc.date.available | 2012-08-08T08:33:18Z | - |
dc.date.issued | 1991 | en_US |
dc.identifier.citation | Applied Physics Letters, 1991, v. 59 n. 20, p. 2582-2584 | - |
dc.identifier.issn | 0003-6951 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/155400 | - |
dc.description.abstract | We report the operation of the first two-dimensional electron gas (2-DEG) emitter heterojunction bipolar transistor. This device, which was grown by molecular beam epitaxy, incorporates an undoped GaAs spacer between the emitter and base of a standard AlGaAs/GaAs single-heterojunction bipolar transistor. The introduction of the spacer layer causes the formation of a 2-DEG at the AlGaAs/GaAs interface. This 2-DEG defines the emitter side of the junction and produces an emitter-base characteristic similar to that of the collector GaAs homojunction. Using a 300 Å GaAs spacer, offset voltages as low as 30 mV have been attained. These devices also exhibit current gains greater than 10 at emitter current densities of 3 A/cm2 and gains up to 400 in the high current density regime. | en_US |
dc.language | eng | en_US |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_US |
dc.relation.ispartof | Applied Physics Letters | en_US |
dc.title | AlGaAs/GaAs heterojunction bipolar transistor with a two-dimensional electron gas emitter | en_US |
dc.type | Article | en_US |
dc.identifier.email | Yang, ES:esyang@hkueee.hku.hk | en_US |
dc.identifier.authority | Yang, ES=rp00199 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1063/1.105909 | en_US |
dc.identifier.scopus | eid_2-s2.0-3643109181 | en_US |
dc.identifier.volume | 59 | en_US |
dc.identifier.issue | 20 | en_US |
dc.identifier.spage | 2582 | en_US |
dc.identifier.epage | 2584 | en_US |
dc.identifier.isi | WOS:A1991GP27500035 | - |
dc.publisher.place | United States | en_US |
dc.identifier.scopusauthorid | Wang, Q=7406911671 | en_US |
dc.identifier.scopusauthorid | Wang, Y=7601501822 | en_US |
dc.identifier.scopusauthorid | Longenbach, KF=6603287889 | en_US |
dc.identifier.scopusauthorid | Yang, ES=7202021229 | en_US |
dc.identifier.scopusauthorid | Wang, WI=7501757397 | en_US |
dc.identifier.issnl | 0003-6951 | - |