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Article: A new capacitance extraction method

TitleA new capacitance extraction method
Authors
Issue Date2004
PublisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandfonline.com/toc/tewa20/current
Citation
Journal Of Electromagnetic Waves And Applications, 2004, v. 18 n. 3, p. 287-299 How to Cite?
AbstractA novel center of charge method (CCM) is introduced to solve multi-conductor capacitance extraction problems. It combines the features of Appel's algorithm and the fast multipole algorithm (FMA). The second order CCM as well as the first order CCM are derived to approximate the far field. The symmetry in the solution can be preserved and the charge distribution can be improved through the second order approximation. The relations between CCM and FMA are studied. Numerical examples demonstrate that CCM uses less CPU time, needs less memory and has very good accuracy compared to MoM and FMA.
Persistent Identifierhttp://hdl.handle.net/10722/155253
ISSN
2023 Impact Factor: 1.2
2023 SCImago Journal Rankings: 0.376
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorJiang, LJen_HK
dc.contributor.authorChew, WCen_HK
dc.date.accessioned2012-08-08T08:32:33Z-
dc.date.available2012-08-08T08:32:33Z-
dc.date.issued2004en_HK
dc.identifier.citationJournal Of Electromagnetic Waves And Applications, 2004, v. 18 n. 3, p. 287-299en_HK
dc.identifier.issn0920-5071en_HK
dc.identifier.urihttp://hdl.handle.net/10722/155253-
dc.description.abstractA novel center of charge method (CCM) is introduced to solve multi-conductor capacitance extraction problems. It combines the features of Appel's algorithm and the fast multipole algorithm (FMA). The second order CCM as well as the first order CCM are derived to approximate the far field. The symmetry in the solution can be preserved and the charge distribution can be improved through the second order approximation. The relations between CCM and FMA are studied. Numerical examples demonstrate that CCM uses less CPU time, needs less memory and has very good accuracy compared to MoM and FMA.en_HK
dc.languageengen_US
dc.publisherTaylor & Francis Ltd. The Journal's web site is located at http://www.tandfonline.com/toc/tewa20/currenten_HK
dc.relation.ispartofJournal of Electromagnetic Waves and Applicationsen_HK
dc.titleA new capacitance extraction methoden_HK
dc.typeArticleen_HK
dc.identifier.emailJiang, LJ: jianglj@hku.hken_HK
dc.identifier.emailChew, WC: wcchew@hku.hken_HK
dc.identifier.authorityJiang, LJ=rp01338en_HK
dc.identifier.authorityChew, WC=rp00656en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-1342329752en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-1342329752&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume18en_HK
dc.identifier.issue3en_HK
dc.identifier.spage287en_HK
dc.identifier.epage299en_HK
dc.identifier.isiWOS:000189246400001-
dc.publisher.placeNetherlandsen_HK
dc.identifier.scopusauthoridJiang, LJ=36077777200en_HK
dc.identifier.scopusauthoridChew, WC=36014436300en_HK
dc.identifier.issnl0920-5071-

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