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Article: Observation of anomalous resistive transition around 160-200 K in Y 5Ba6Cu11Ox thin films

TitleObservation of anomalous resistive transition around 160-200 K in Y 5Ba6Cu11Ox thin films
Authors
Ma, QYChang, CAYang, ES
Issue Date1991
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 1991, v. 69 n. 10, p. 7348-7350 How to Cite?
DOI: http://dx.doi.org/10.1063/1.347592
AbstractA large resistive transition between 160-200 K has been observed in Y 5Ba6Cu11Ox thin films. The films were deposited on MgO substrates by electron-beam evaporation and annealed through rapid thermal annealing. With 960-980°C, 30-60 s RTA, the films showed a resistance drop about one order of magnitude around 160-200 K. This resistive transition was measured reproducibly over many samples. The preparations and measurements of the Y5Ba6Cu 11Ox films were similar to those of the YBa 2Cu3O7-x films. The x-ray diffraction pattern indicated that the films mainly contain the YBa2Cu3O 7-x phase. The films were polycrystalline with grain sizes of a few μm and an average thickness of 0.4 μm.
Persistent Identifierhttp://hdl.handle.net/10722/155212
ISSN
0021-8979
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID
WOS:A1991FM77100087

 

DC FieldValueLanguage
dc.contributor.authorMa, QYen_US
dc.contributor.authorChang, CAen_US
dc.contributor.authorYang, ESen_US
dc.date.accessioned2012-08-08T08:32:22Z-
dc.date.available2012-08-08T08:32:22Z-
dc.date.issued1991en_US
dc.identifier.citationJournal of Applied Physics, 1991, v. 69 n. 10, p. 7348-7350-
dc.identifier.issn0021-8979en_US
dc.identifier.urihttp://hdl.handle.net/10722/155212-
dc.description.abstractA large resistive transition between 160-200 K has been observed in Y 5Ba6Cu11Ox thin films. The films were deposited on MgO substrates by electron-beam evaporation and annealed through rapid thermal annealing. With 960-980°C, 30-60 s RTA, the films showed a resistance drop about one order of magnitude around 160-200 K. This resistive transition was measured reproducibly over many samples. The preparations and measurements of the Y5Ba6Cu 11Ox films were similar to those of the YBa 2Cu3O7-x films. The x-ray diffraction pattern indicated that the films mainly contain the YBa2Cu3O 7-x phase. The films were polycrystalline with grain sizes of a few μm and an average thickness of 0.4 μm.en_US
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jspen_US
dc.relation.ispartofJournal of Applied Physicsen_US
dc.titleObservation of anomalous resistive transition around 160-200 K in Y 5Ba6Cu11Ox thin filmsen_US
dc.typeArticleen_US
dc.identifier.emailYang, ES:esyang@hkueee.hku.hken_US
dc.identifier.authorityYang, ES=rp00199en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1063/1.347592en_US
dc.identifier.scopuseid_2-s2.0-0041910703en_US
dc.identifier.volume69en_US
dc.identifier.issue10en_US
dc.identifier.spage7348en_US
dc.identifier.epage7350en_US
dc.identifier.isiWOS:A1991FM77100087-
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridMa, QY=7402815617en_US
dc.identifier.scopusauthoridChang, CA=7407042938en_US
dc.identifier.scopusauthoridYang, ES=7202021229en_US
dc.identifier.issnl0021-8979-

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