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Article: Effective apparatus for at-speed self-testing

TitleEffective apparatus for at-speed self-testing
Authors
Li, XiaoweiCheung, Paul YS
Issue Date1999
Citation
Conference Record - Ieee Instrumentation And Measurement Technology Conference, 1999, v. 2, p. 844-848 How to Cite?
AbstractThis paper presents a loop-based BIST scheme for at-speed testing. The structure and operation modes of the BIST scheme are described. The topological properties of the state-transition-graph of the proposed BIST scheme are analyzed. Based on it, an approach to design and efficiently implement the proposed BIST scheme have been developed. Experimental results on academic benchmark circuits are presented to demonstrate the effectiveness of the proposed BIST scheme as well as the design approach.
Persistent Identifierhttp://hdl.handle.net/10722/155110

 

DC FieldValueLanguage
dc.contributor.authorLi, Xiaoweien_US
dc.contributor.authorCheung, Paul YSen_US
dc.date.accessioned2012-08-08T08:31:54Z-
dc.date.available2012-08-08T08:31:54Z-
dc.date.issued1999en_US
dc.identifier.citationConference Record - Ieee Instrumentation And Measurement Technology Conference, 1999, v. 2, p. 844-848en_US
dc.identifier.urihttp://hdl.handle.net/10722/155110-
dc.description.abstractThis paper presents a loop-based BIST scheme for at-speed testing. The structure and operation modes of the BIST scheme are described. The topological properties of the state-transition-graph of the proposed BIST scheme are analyzed. Based on it, an approach to design and efficiently implement the proposed BIST scheme have been developed. Experimental results on academic benchmark circuits are presented to demonstrate the effectiveness of the proposed BIST scheme as well as the design approach.en_US
dc.languageengen_US
dc.relation.ispartofConference Record - IEEE Instrumentation and Measurement Technology Conferenceen_US
dc.titleEffective apparatus for at-speed self-testingen_US
dc.typeArticleen_US
dc.identifier.emailCheung, Paul YS:paul.cheung@hku.hken_US
dc.identifier.authorityCheung, Paul YS=rp00077en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0032679612en_US
dc.identifier.volume2en_US
dc.identifier.spage844en_US
dc.identifier.epage848en_US
dc.identifier.scopusauthoridLi, Xiaowei=8228906100en_US
dc.identifier.scopusauthoridCheung, Paul YS=7202595335en_US

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