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- Publisher Website: 10.1049/el:19941277
- Scopus: eid_2-s2.0-0028526549
- WOS: WOS:A1994PT07900059
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Article: Pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP HEMT grown by MOVPE using TBP and TBA
| Title | Pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP HEMT grown by MOVPE using TBP and TBA |
|---|---|
| Authors | |
| Keywords | High electron mobility tramsistors Vapour phase epitaxial growth |
| Issue Date | 1994 |
| Publisher | The Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL |
| Citation | Electronics Letters, 1994, v. 30 n. 22, p. 1894-1895 How to Cite? |
| Abstract | A pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP high electron mobility transistor grown by MOVPE using TBP and TBA is reported for the first time. The extrinsic transconductances of 480 and 620mS/mm with the maximum output current of 660 and 780mA/mm were achieved for the 1.2μm gate length device at 300 and 77K, respectively. These data are comparable to those of AlInAs/GaInAs HEMTs grown by MOVPE and MBE indicating the good material quality |
| Persistent Identifier | http://hdl.handle.net/10722/155007 |
| ISSN | 2023 Impact Factor: 0.7 2023 SCImago Journal Rankings: 0.323 |
| ISI Accession Number ID |
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Yang, YF | en_US |
| dc.contributor.author | Hsu, CC | en_US |
| dc.contributor.author | Yang, ES | en_US |
| dc.date.accessioned | 2012-08-08T08:31:29Z | - |
| dc.date.available | 2012-08-08T08:31:29Z | - |
| dc.date.issued | 1994 | en_US |
| dc.identifier.citation | Electronics Letters, 1994, v. 30 n. 22, p. 1894-1895 | en_US |
| dc.identifier.issn | 0013-5194 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10722/155007 | - |
| dc.description.abstract | A pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP high electron mobility transistor grown by MOVPE using TBP and TBA is reported for the first time. The extrinsic transconductances of 480 and 620mS/mm with the maximum output current of 660 and 780mA/mm were achieved for the 1.2μm gate length device at 300 and 77K, respectively. These data are comparable to those of AlInAs/GaInAs HEMTs grown by MOVPE and MBE indicating the good material quality | en_US |
| dc.language | eng | en_US |
| dc.publisher | The Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL | en_US |
| dc.relation.ispartof | Electronics Letters | en_US |
| dc.subject | High electron mobility tramsistors | - |
| dc.subject | Vapour phase epitaxial growth | - |
| dc.title | Pseudomorphic Ga0.2In0.8P/Ga0.47In0.53As/InP HEMT grown by MOVPE using TBP and TBA | en_US |
| dc.type | Article | en_US |
| dc.identifier.email | Yang, ES:esyang@hkueee.hku.hk | en_US |
| dc.identifier.authority | Yang, ES=rp00199 | en_US |
| dc.description.nature | link_to_subscribed_fulltext | en_US |
| dc.identifier.doi | 10.1049/el:19941277 | en_US |
| dc.identifier.scopus | eid_2-s2.0-0028526549 | en_US |
| dc.identifier.volume | 30 | en_US |
| dc.identifier.issue | 22 | en_US |
| dc.identifier.spage | 1894 | en_US |
| dc.identifier.epage | 1895 | en_US |
| dc.identifier.isi | WOS:A1994PT07900059 | - |
| dc.publisher.place | United Kingdom | en_US |
| dc.identifier.scopusauthorid | Yang, YF=7409383278 | en_US |
| dc.identifier.scopusauthorid | Hsu, CC=7404947020 | en_US |
| dc.identifier.scopusauthorid | Yang, ES=7202021229 | en_US |
| dc.identifier.issnl | 0013-5194 | - |
