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Conference Paper: Characterization of polysilicon contacts by photoconductance measurements
Title | Characterization of polysilicon contacts by photoconductance measurements |
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Authors | |
Issue Date | 1988 |
Citation | The 1988 Bipolar Circuits and Technology Meeting; Minneapolis, MN, USA How to Cite? |
Abstract | The confinement property of polysilicon contacts, leading to storage of minority carriers, has been studied using the photoconductivity technique. Steady-state and transient optical measurement show a considerable increase of stored carriers by these contacts. A model has been developed that allows the extraction of contact parameters. |
Persistent Identifier | http://hdl.handle.net/10722/154880 |
DC Field | Value | Language |
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dc.contributor.author | Jalali, B | en_US |
dc.contributor.author | Yang, ES | en_US |
dc.date.accessioned | 2012-08-08T08:31:01Z | - |
dc.date.available | 2012-08-08T08:31:01Z | - |
dc.date.issued | 1988 | en_US |
dc.identifier.citation | The 1988 Bipolar Circuits and Technology Meeting; Minneapolis, MN, USA | - |
dc.identifier.uri | http://hdl.handle.net/10722/154880 | - |
dc.description.abstract | The confinement property of polysilicon contacts, leading to storage of minority carriers, has been studied using the photoconductivity technique. Steady-state and transient optical measurement show a considerable increase of stored carriers by these contacts. A model has been developed that allows the extraction of contact parameters. | en_US |
dc.language | eng | en_US |
dc.title | Characterization of polysilicon contacts by photoconductance measurements | en_US |
dc.type | Conference_Paper | en_US |
dc.identifier.email | Yang, ES:esyang@hkueee.hku.hk | en_US |
dc.identifier.authority | Yang, ES=rp00199 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.scopus | eid_2-s2.0-0024127902 | en_US |
dc.identifier.scopusauthorid | Jalali, B=7004889917 | en_US |
dc.identifier.scopusauthorid | Yang, ES=7202021229 | en_US |