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Conference Paper: Characterization of polysilicon contacts by photoconductance measurements

TitleCharacterization of polysilicon contacts by photoconductance measurements
Authors
Issue Date1988
Citation
The 1988 Bipolar Circuits and Technology Meeting; Minneapolis, MN, USA How to Cite?
AbstractThe confinement property of polysilicon contacts, leading to storage of minority carriers, has been studied using the photoconductivity technique. Steady-state and transient optical measurement show a considerable increase of stored carriers by these contacts. A model has been developed that allows the extraction of contact parameters.
Persistent Identifierhttp://hdl.handle.net/10722/154880

 

DC FieldValueLanguage
dc.contributor.authorJalali, Ben_US
dc.contributor.authorYang, ESen_US
dc.date.accessioned2012-08-08T08:31:01Z-
dc.date.available2012-08-08T08:31:01Z-
dc.date.issued1988en_US
dc.identifier.citationThe 1988 Bipolar Circuits and Technology Meeting; Minneapolis, MN, USA-
dc.identifier.urihttp://hdl.handle.net/10722/154880-
dc.description.abstractThe confinement property of polysilicon contacts, leading to storage of minority carriers, has been studied using the photoconductivity technique. Steady-state and transient optical measurement show a considerable increase of stored carriers by these contacts. A model has been developed that allows the extraction of contact parameters.en_US
dc.languageengen_US
dc.titleCharacterization of polysilicon contacts by photoconductance measurementsen_US
dc.typeConference_Paperen_US
dc.identifier.emailYang, ES:esyang@hkueee.hku.hken_US
dc.identifier.authorityYang, ES=rp00199en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0024127902en_US
dc.identifier.scopusauthoridJalali, B=7004889917en_US
dc.identifier.scopusauthoridYang, ES=7202021229en_US

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