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Conference Paper: ELECTRONIC PROPERTIES OF GRAIN BOUNDARIES IN POLYCRYSTALLINE SILICON.

TitleELECTRONIC PROPERTIES OF GRAIN BOUNDARIES IN POLYCRYSTALLINE SILICON.
Authors
Issue Date1983
PublisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xml
Citation
Proceedings Of Spie - The International Society For Optical Engineering, 1983, v. 385, p. 59-64 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/154826
ISSN

 

DC FieldValueLanguage
dc.contributor.authorYang, ESen_US
dc.contributor.authorPoon, Een_US
dc.contributor.authorEvans, HLen_US
dc.contributor.authorHwang, Wen_US
dc.contributor.authorSong, JSen_US
dc.contributor.authorWu, CMen_US
dc.date.accessioned2012-08-08T08:30:49Z-
dc.date.available2012-08-08T08:30:49Z-
dc.date.issued1983en_US
dc.identifier.citationProceedings Of Spie - The International Society For Optical Engineering, 1983, v. 385, p. 59-64en_US
dc.identifier.issn0277-786Xen_US
dc.identifier.urihttp://hdl.handle.net/10722/154826-
dc.languageengen_US
dc.publisherS P I E - International Society for Optical Engineering. The Journal's web site is located at http://spie.org/x1848.xmlen_US
dc.relation.ispartofProceedings of SPIE - The International Society for Optical Engineeringen_US
dc.titleELECTRONIC PROPERTIES OF GRAIN BOUNDARIES IN POLYCRYSTALLINE SILICON.en_US
dc.typeConference_Paperen_US
dc.identifier.emailYang, ES:esyang@hkueee.hku.hken_US
dc.identifier.authorityYang, ES=rp00199en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0020940111en_US
dc.identifier.volume385en_US
dc.identifier.spage59en_US
dc.identifier.epage64en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridYang, ES=7202021229en_US
dc.identifier.scopusauthoridPoon, E=7003615942en_US
dc.identifier.scopusauthoridEvans, HL=7401520988en_US
dc.identifier.scopusauthoridHwang, W=25630510100en_US
dc.identifier.scopusauthoridSong, JS=7404787440en_US
dc.identifier.scopusauthoridWu, CM=7501663415en_US

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