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Article: Effects of surface tension on the size-dependent ferroelectric characteristics of free-standing BaTiO3 nano-thin films

TitleEffects of surface tension on the size-dependent ferroelectric characteristics of free-standing BaTiO3 nano-thin films
Authors
KeywordsCoercive field
Critical state
Domain structure
Ferroelectric characteristics
Ferroelectric property
Issue Date2011
PublisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp
Citation
Journal of Applied Physics, 2011, v. 110 n. 8, article no. 084108 How to Cite?
AbstractIntrinsic surface tension of nanoscale ferroelectric thin film tends to induce tensile stress in its surface layer, whereas the other portion of the film is subjected to compression to maintain mechanical balance. A continuum-based phase-field model accounting for such surface effect has been set up to investigate the evolution of domain structure and thickness-dependent ferroelectric properties of free-standing BaTiO 3 nano-thin films. It was observed that both remnant polarization and coercive field decrease with a decrease of film thickness and increase of surface tension, and that, for film thickness ranging from 10-20 nm, both properties decreased sharply at the surface strain 2-3ε 0 (ε 0 being the spontaneous strain). Further decrease in film thickness or increase in surface tension could result in loss of ferroelectricity. Such a critical state for the ferroelectric-to-paraelectric transition has also been established for the range of film thickness 4-20 nm. © 2011 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/152712
ISSN
2023 Impact Factor: 2.7
2023 SCImago Journal Rankings: 0.649
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorSu, Yen_US
dc.contributor.authorChen, Hen_US
dc.contributor.authorLi, JJen_US
dc.contributor.authorSoh, AKen_US
dc.contributor.authorWeng, GJ-
dc.date.accessioned2012-07-16T09:46:52Z-
dc.date.available2012-07-16T09:46:52Z-
dc.date.issued2011en_US
dc.identifier.citationJournal of Applied Physics, 2011, v. 110 n. 8, article no. 084108-
dc.identifier.issn0021-8979-
dc.identifier.urihttp://hdl.handle.net/10722/152712-
dc.description.abstractIntrinsic surface tension of nanoscale ferroelectric thin film tends to induce tensile stress in its surface layer, whereas the other portion of the film is subjected to compression to maintain mechanical balance. A continuum-based phase-field model accounting for such surface effect has been set up to investigate the evolution of domain structure and thickness-dependent ferroelectric properties of free-standing BaTiO 3 nano-thin films. It was observed that both remnant polarization and coercive field decrease with a decrease of film thickness and increase of surface tension, and that, for film thickness ranging from 10-20 nm, both properties decreased sharply at the surface strain 2-3ε 0 (ε 0 being the spontaneous strain). Further decrease in film thickness or increase in surface tension could result in loss of ferroelectricity. Such a critical state for the ferroelectric-to-paraelectric transition has also been established for the range of film thickness 4-20 nm. © 2011 American Institute of Physics.-
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://jap.aip.org/jap/staff.jsp-
dc.relation.ispartofJournal of Applied Physicsen_US
dc.rightsCopyright 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, 2011, v. 110 n. 8, article no. 084108 and may be found at https://doi.org/10.1063/1.3652906-
dc.subjectCoercive field-
dc.subjectCritical state-
dc.subjectDomain structure-
dc.subjectFerroelectric characteristics-
dc.subjectFerroelectric property-
dc.titleEffects of surface tension on the size-dependent ferroelectric characteristics of free-standing BaTiO3 nano-thin filmsen_US
dc.typeArticleen_US
dc.identifier.emailSoh, AK: aksoh@hkucc.hku.hken_US
dc.identifier.emailWeng, GJ: weng@jove.rutgers.edu-
dc.identifier.authoritySoh, AK=rp00170en_US
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1063/1.3652906-
dc.identifier.scopuseid_2-s2.0-80655139057-
dc.identifier.hkuros200548en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-80655139057&selection=ref&src=s&origin=recordpage-
dc.identifier.volume110en_US
dc.identifier.issue8-
dc.identifier.spagearticle no. 084108-
dc.identifier.epagearticle no. 084108-
dc.identifier.isiWOS:000296519900114-
dc.publisher.placeUnited States-
dc.identifier.scopusauthoridSu, Y=7404456466-
dc.identifier.scopusauthoridChen, H=54402675800-
dc.identifier.scopusauthoridLi, JJ=54403200200-
dc.identifier.scopusauthoridSoh, AK=7006795203-
dc.identifier.scopusauthoridWeng, GJ=7006124528-
dc.identifier.issnl0021-8979-

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