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Article: Optimal sampling of parametric surfaces

TitleOptimal sampling of parametric surfaces
Authors
KeywordsOptimal sampling
Parametric surfaces
Reparameterization
Parameterization
Parametric devices
Issue Date2011
PublisherCAD Solutions. The Journal's web site is located at http://www.cadanda.com
Citation
Computer-Aided Design and Applications, 2011, v. 9 n. 1, p. 55-60 How to Cite?
AbstractWe study the problem of optimally sampling parametric surfaces by means of reparameterization. A criterion is first formulated for measuring the parameterization quality of a given surface. According to this criterion, the optimal parameterization is identified for the surface by exploring admissible reparameterizations. Then the optimal sampling of the surface is obtained by uniformly sampling the parameter domain of the optimal parameterization. © 2012 CAD Solutions, LLC.
Persistent Identifierhttp://hdl.handle.net/10722/152484
ISSN
2015 SCImago Journal Rankings: 0.310
References

 

DC FieldValueLanguage
dc.contributor.authorLi, Yen_US
dc.contributor.authorWang, Wen_US
dc.contributor.authorTu, Cen_US
dc.date.accessioned2012-06-26T06:39:34Z-
dc.date.available2012-06-26T06:39:34Z-
dc.date.issued2011en_US
dc.identifier.citationComputer-Aided Design and Applications, 2011, v. 9 n. 1, p. 55-60en_US
dc.identifier.issn1686-4360en_US
dc.identifier.urihttp://hdl.handle.net/10722/152484-
dc.description.abstractWe study the problem of optimally sampling parametric surfaces by means of reparameterization. A criterion is first formulated for measuring the parameterization quality of a given surface. According to this criterion, the optimal parameterization is identified for the surface by exploring admissible reparameterizations. Then the optimal sampling of the surface is obtained by uniformly sampling the parameter domain of the optimal parameterization. © 2012 CAD Solutions, LLC.en_US
dc.languageengen_US
dc.publisherCAD Solutions. The Journal's web site is located at http://www.cadanda.comen_US
dc.relation.ispartofComputer-Aided Design and Applicationsen_US
dc.subjectOptimal samplingen_US
dc.subjectParametric surfacesen_US
dc.subjectReparameterizationen_US
dc.subjectParameterization-
dc.subjectParametric devices-
dc.titleOptimal sampling of parametric surfacesen_US
dc.typeArticleen_US
dc.identifier.emailLi, Y: yfli@cs.hku.hken_US
dc.identifier.emailWang, W: wenping@cs.hku.hk-
dc.identifier.emailTu, C: chtu@sdu.edu.cn-
dc.identifier.authorityWang, W=rp00186en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.3722/cadaps.2012.55-60en_US
dc.identifier.scopuseid_2-s2.0-83655172605en_US
dc.identifier.hkuros194926-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-83655172605&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume9en_US
dc.identifier.issue1en_US
dc.identifier.spage55en_US
dc.identifier.epage60en_US
dc.publisher.placeUnited Statesen_US
dc.identifier.scopusauthoridTu, C=7402578832en_US
dc.identifier.scopusauthoridWang, W=35147101600en_US
dc.identifier.scopusauthoridLi, Y=37077362300en_US

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