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Article: Checking key integrity efficiently for high-speed quantum key distribution using combinatorial group testing

TitleChecking key integrity efficiently for high-speed quantum key distribution using combinatorial group testing
Authors
KeywordsCombinatorial Group Testing
Key Integrity
Quantum Key Distribution
Shifted Transversal Design
Issue Date2011
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/optcom
Citation
Optics Communications, 2011, v. 284 n. 1, p. 531-535 How to Cite?
AbstractWith the increasing key generation rate in practical quantum key distribution, checking key integrity efficiently becomes an important problem. Since the original method that utilizes one hash value for a key string has to discard all the key bits even if just one error bit exists, it may eventually limit the practical rate of key generation. In this paper, we propose a new scheme based on combinatorial group testing to identify the rare error bits so as to avoid dropping all the key bits. Experimental results show that the scheme can precisely locate the error bits if the number of error bits is within the maximum guaranteed number set by the scheme while the overhead is insignificant (for a 106-bit key, additional bits: 0.1% of the key; hashing time: 16 ms; checking time: 22 ms) and it can still keep the majority of the correct bits (95%) even if the number of error bits is 10 times of the maximum. The results also indicate that the minimum key size for the CGT-based scheme to gain an advantage over the original method is about 2 × 104 bits. © 2010 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/152448
ISSN
2015 Impact Factor: 1.48
2015 SCImago Journal Rankings: 0.778
ISI Accession Number ID
Funding AgencyGrant Number
Research Grants Council of the Hong Kong Special Administrative Region, ChinaRGC GRF HKU 713009E
HKU200811159155
Funding Information:

The work described in this paper was partially supported by the General Research Fund from the Research Grants Council of the Hong Kong Special Administrative Region, China (Project No. RGC GRF HKU 713009E), and a HKU Seed Funding Programme for Basic Research Grant No. 200811159155.

References

 

DC FieldValueLanguage
dc.contributor.authorFang, Jen_US
dc.contributor.authorJiang, ZLen_US
dc.contributor.authorYiu, SMen_US
dc.contributor.authorHui, LCKen_US
dc.date.accessioned2012-06-26T06:39:10Z-
dc.date.available2012-06-26T06:39:10Z-
dc.date.issued2011en_US
dc.identifier.citationOptics Communications, 2011, v. 284 n. 1, p. 531-535en_US
dc.identifier.issn0030-4018en_US
dc.identifier.urihttp://hdl.handle.net/10722/152448-
dc.description.abstractWith the increasing key generation rate in practical quantum key distribution, checking key integrity efficiently becomes an important problem. Since the original method that utilizes one hash value for a key string has to discard all the key bits even if just one error bit exists, it may eventually limit the practical rate of key generation. In this paper, we propose a new scheme based on combinatorial group testing to identify the rare error bits so as to avoid dropping all the key bits. Experimental results show that the scheme can precisely locate the error bits if the number of error bits is within the maximum guaranteed number set by the scheme while the overhead is insignificant (for a 106-bit key, additional bits: 0.1% of the key; hashing time: 16 ms; checking time: 22 ms) and it can still keep the majority of the correct bits (95%) even if the number of error bits is 10 times of the maximum. The results also indicate that the minimum key size for the CGT-based scheme to gain an advantage over the original method is about 2 × 104 bits. © 2010 Elsevier B.V. All rights reserved.en_US
dc.languageengen_US
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/optcomen_US
dc.relation.ispartofOptics Communicationsen_US
dc.subjectCombinatorial Group Testingen_US
dc.subjectKey Integrityen_US
dc.subjectQuantum Key Distributionen_US
dc.subjectShifted Transversal Designen_US
dc.titleChecking key integrity efficiently for high-speed quantum key distribution using combinatorial group testingen_US
dc.typeArticleen_US
dc.identifier.emailYiu, SM:smyiu@cs.hku.hken_US
dc.identifier.emailHui, LCK:hui@cs.hku.hken_US
dc.identifier.authorityYiu, SM=rp00207en_US
dc.identifier.authorityHui, LCK=rp00120en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/j.optcom.2010.08.066en_US
dc.identifier.scopuseid_2-s2.0-78649685976en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-78649685976&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume284en_US
dc.identifier.issue1en_US
dc.identifier.spage531en_US
dc.identifier.epage535en_US
dc.identifier.isiWOS:000285893200096-
dc.publisher.placeNetherlandsen_US
dc.identifier.scopusauthoridFang, J=36132767400en_US
dc.identifier.scopusauthoridJiang, ZL=24344329800en_US
dc.identifier.scopusauthoridYiu, SM=7003282240en_US
dc.identifier.scopusauthoridHui, LCK=8905728300en_US

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