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Conference Paper: Applying neural networks in reliability analysis of a panel pillar

TitleApplying neural networks in reliability analysis of a panel pillar
Authors
KeywordsNeural Networks (Nn)
Panel Pillar
Reliability Analysis
Issue Date2002
Citation
Proceedings In Mining Science And Safety Technology, 2002, p. 187-191 How to Cite?
AbstractThe panel pillar in the drilling room plays an important role in keeping the stability of the stope roof in backfill mining method of Feng huangshan copper mine. Reliability analysis method is introduced to optimize the panel pillar in this paper. Reliability analysis and design of the pillar structure is performed using neural networks. The results show that the rational design value of the panel pillar diameter should be confined to the limit between 3.4m and 3.6m.
Persistent Identifierhttp://hdl.handle.net/10722/152124
References

 

DC FieldValueLanguage
dc.contributor.authorDeng, Jen_US
dc.contributor.authorYue, Zen_US
dc.contributor.authorZhu, Hen_US
dc.date.accessioned2012-06-26T06:35:20Z-
dc.date.available2012-06-26T06:35:20Z-
dc.date.issued2002en_US
dc.identifier.citationProceedings In Mining Science And Safety Technology, 2002, p. 187-191en_US
dc.identifier.urihttp://hdl.handle.net/10722/152124-
dc.description.abstractThe panel pillar in the drilling room plays an important role in keeping the stability of the stope roof in backfill mining method of Feng huangshan copper mine. Reliability analysis method is introduced to optimize the panel pillar in this paper. Reliability analysis and design of the pillar structure is performed using neural networks. The results show that the rational design value of the panel pillar diameter should be confined to the limit between 3.4m and 3.6m.en_US
dc.languageengen_US
dc.relation.ispartofProceedings in Mining Science and Safety Technologyen_US
dc.subjectNeural Networks (Nn)en_US
dc.subjectPanel Pillaren_US
dc.subjectReliability Analysisen_US
dc.titleApplying neural networks in reliability analysis of a panel pillaren_US
dc.typeConference_Paperen_US
dc.identifier.emailYue, Z:yueqzq@hkucc.hku.hken_US
dc.identifier.authorityYue, Z=rp00209en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-1542347055en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-1542347055&selection=ref&src=s&origin=recordpageen_US
dc.identifier.spage187en_US
dc.identifier.epage191en_US
dc.identifier.scopusauthoridDeng, J=7402612836en_US
dc.identifier.scopusauthoridYue, Z=7102782735en_US
dc.identifier.scopusauthoridZhu, H=7404663867en_US

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