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Article: Studies of thermal stability of charges associated with thermal transfer of OSL from quartz

TitleStudies of thermal stability of charges associated with thermal transfer of OSL from quartz
Authors
Issue Date2006
PublisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpd
Citation
Journal Of Physics D: Applied Physics, 2006, v. 39 n. 14, p. 2941-2949 How to Cite?
AbstractIn this paper we study optically stimulated luminescence (OSL) signals created by basic thermal transfer. The thermal stabilities of trapped charges associated with the source traps of thermal transfer and their related OSL traps, and trapped holes associated with non-luminescent centres (R centres) were studied for a sedimentary quartz, using isothermal annealing and pulse annealing methods. The thermally transferred charges are mainly from three groups of traps (source traps), shallow, medium and deep traps. Kinetic analysis indicates that the medium and deep source traps have trap depths of ∼1.1 eV and ∼1.5 eV, and lifetimes 7.6 × 105 and 6.0 × 1011 years at 20 °C, respectively. Two kinds of OSL traps, one unstable and the other stable, are identified as accepting charges during thermal transfer. These OSL traps have different thermal stabilities from the main OSL traps, which are associated with the 325 °C TL peak. The results also indicate that the basic thermal transfer related OSL signals perhaps use different R centres from the dose-generated fast bleachable OSL signals. © 2006 IOP Publishing Ltd.
Persistent Identifierhttp://hdl.handle.net/10722/151190
ISSN
2015 Impact Factor: 2.772
2015 SCImago Journal Rankings: 0.682
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorLi, Ben_US
dc.contributor.authorLi, SHen_US
dc.date.accessioned2012-06-26T06:18:28Z-
dc.date.available2012-06-26T06:18:28Z-
dc.date.issued2006en_US
dc.identifier.citationJournal Of Physics D: Applied Physics, 2006, v. 39 n. 14, p. 2941-2949en_US
dc.identifier.issn0022-3727en_US
dc.identifier.urihttp://hdl.handle.net/10722/151190-
dc.description.abstractIn this paper we study optically stimulated luminescence (OSL) signals created by basic thermal transfer. The thermal stabilities of trapped charges associated with the source traps of thermal transfer and their related OSL traps, and trapped holes associated with non-luminescent centres (R centres) were studied for a sedimentary quartz, using isothermal annealing and pulse annealing methods. The thermally transferred charges are mainly from three groups of traps (source traps), shallow, medium and deep traps. Kinetic analysis indicates that the medium and deep source traps have trap depths of ∼1.1 eV and ∼1.5 eV, and lifetimes 7.6 × 105 and 6.0 × 1011 years at 20 °C, respectively. Two kinds of OSL traps, one unstable and the other stable, are identified as accepting charges during thermal transfer. These OSL traps have different thermal stabilities from the main OSL traps, which are associated with the 325 °C TL peak. The results also indicate that the basic thermal transfer related OSL signals perhaps use different R centres from the dose-generated fast bleachable OSL signals. © 2006 IOP Publishing Ltd.en_US
dc.languageengen_US
dc.publisherInstitute of Physics Publishing. The Journal's web site is located at http://www.iop.org/Journals/jpden_US
dc.relation.ispartofJournal of Physics D: Applied Physicsen_US
dc.titleStudies of thermal stability of charges associated with thermal transfer of OSL from quartzen_US
dc.typeArticleen_US
dc.identifier.emailLi, B:boli@hku.hken_US
dc.identifier.emailLi, SH:shli@hku.hken_US
dc.identifier.authorityLi, B=rp00736en_US
dc.identifier.authorityLi, SH=rp00740en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1088/0022-3727/39/14/011en_US
dc.identifier.scopuseid_2-s2.0-33745685671en_US
dc.identifier.hkuros120858-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33745685671&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume39en_US
dc.identifier.issue14en_US
dc.identifier.spage2941en_US
dc.identifier.epage2949en_US
dc.identifier.isiWOS:000238970100012-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridLi, B=36072316000en_US
dc.identifier.scopusauthoridLi, SH=24438103700en_US
dc.identifier.citeulike748617-

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