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Article: Study of the 110 °C TL peak sensitivity in optical dating of quartz
Title | Study of the 110 °C TL peak sensitivity in optical dating of quartz |
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Authors | |
Issue Date | 2000 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/radmeas |
Citation | Radiation Measurements, 2000, v. 32 n. 5-6, p. 641-645 How to Cite? |
Abstract | As the 110 °C TL emission in quartz uses the same luminescence centers as the OSL emission, the 110 °C TL signal from a test dose may be used to monitor the OSL sensitivity change. It is thus important to study the relationship between the 110 °C TL peak and the OSL sensitivity in studies related to optical dating from quartz. We have conducted a series of experiments using sedimentary quartz, where the annealing temperatures were varied between 260 and 1000 °C before the measurement of OSL and 110 °C TL sensitivities. Another series of experiments on two sedimentary quartz samples investigated the 110 °C TL peak and OSL dose-dependent sensitivity change after different annealing temperatures. In these experiments, the 110 °C TL and OSL signals from the test dose are shown to have similar sensitization characteristics: the 110 °C TL sensitivity change is proportional to the OSL sensitivity change if the annealing temperature is lower than 500 °C. It is concluded that the 110 °C TL signal can be used to correct the OSL sensitivity change in the single-aliquot additive-dose protocol. |
Persistent Identifier | http://hdl.handle.net/10722/151118 |
ISSN | 2023 Impact Factor: 1.6 2023 SCImago Journal Rankings: 0.463 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Chen, G | en_US |
dc.contributor.author | Li, SH | en_US |
dc.contributor.author | Murray, AS | en_US |
dc.date.accessioned | 2012-06-26T06:17:17Z | - |
dc.date.available | 2012-06-26T06:17:17Z | - |
dc.date.issued | 2000 | en_US |
dc.identifier.citation | Radiation Measurements, 2000, v. 32 n. 5-6, p. 641-645 | en_US |
dc.identifier.issn | 1350-4487 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/151118 | - |
dc.description.abstract | As the 110 °C TL emission in quartz uses the same luminescence centers as the OSL emission, the 110 °C TL signal from a test dose may be used to monitor the OSL sensitivity change. It is thus important to study the relationship between the 110 °C TL peak and the OSL sensitivity in studies related to optical dating from quartz. We have conducted a series of experiments using sedimentary quartz, where the annealing temperatures were varied between 260 and 1000 °C before the measurement of OSL and 110 °C TL sensitivities. Another series of experiments on two sedimentary quartz samples investigated the 110 °C TL peak and OSL dose-dependent sensitivity change after different annealing temperatures. In these experiments, the 110 °C TL and OSL signals from the test dose are shown to have similar sensitization characteristics: the 110 °C TL sensitivity change is proportional to the OSL sensitivity change if the annealing temperature is lower than 500 °C. It is concluded that the 110 °C TL signal can be used to correct the OSL sensitivity change in the single-aliquot additive-dose protocol. | en_US |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/radmeas | en_US |
dc.relation.ispartof | Radiation Measurements | en_US |
dc.title | Study of the 110 °C TL peak sensitivity in optical dating of quartz | en_US |
dc.type | Article | en_US |
dc.identifier.email | Li, SH: shli@hku.hk | en_US |
dc.identifier.authority | Li, SH=rp00740 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1016/S1350-4487(00)00129-3 | en_US |
dc.identifier.scopus | eid_2-s2.0-0343664403 | en_US |
dc.identifier.hkuros | 63430 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0343664403&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 32 | en_US |
dc.identifier.issue | 5 | en_US |
dc.identifier.spage | 641 | en_US |
dc.identifier.epage | 645 | en_US |
dc.identifier.isi | WOS:000090099400038 | - |
dc.publisher.place | United Kingdom | en_US |
dc.identifier.scopusauthorid | Chen, G=7407505500 | en_US |
dc.identifier.scopusauthorid | Li, SH=24438103700 | en_US |
dc.identifier.scopusauthorid | Murray, AS=7401932735 | en_US |
dc.identifier.issnl | 1350-4487 | - |