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Article: Tests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state tests
Title | Tests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state tests | ||||
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Authors | |||||
Keywords | Bolted connections Elevated temperature Thin sheet Transient state test Ultimate strength | ||||
Issue Date | 2011 | ||||
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/tws | ||||
Citation | Thin-walled Structures, 2011, v. 49 n. 10, p. 1334-1340 How to Cite? | ||||
Abstract | A total of 62 single shear bolted connection specimens were tested using transient state test method. The specimens of single shear bolted connections were fabricated by three different thicknesses of thin sheet steels. The tests were conducted at three different load levels of 25%, 50% and 75% of the failure load at ambient temperature. The tendency of the test strength reduction of the single shear bolted connections conducted using the transient state test method is generally similar to that for the steady state test method. However, it is shown that the transient state test results are always conservative compared with the steady state test results. Three main failure modes, namely the bearing, tear out and net section tension, were observed in the transient state tests. The failure modes of the specimens in transient state tests for the load level of 0.25 of the failure load at ambient temperature are generally consistent with those specimens in the steady state tests. © 2011 Elsevier Ltd. All rights reserved. | ||||
Persistent Identifier | http://hdl.handle.net/10722/150582 | ||||
ISSN | 2023 Impact Factor: 5.7 2023 SCImago Journal Rankings: 1.527 | ||||
ISI Accession Number ID |
Funding Information: The authors are grateful to BlueScope Lysaght (Singapore) Pte Ltd for providing the thin sheet steels. The research work described in this paper was supported by a grant from The University of Hong Kong under the seed funding program for basic research. | ||||
References |
DC Field | Value | Language |
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dc.contributor.author | Yan, S | en_US |
dc.contributor.author | Young, B | en_US |
dc.date.accessioned | 2012-06-26T06:05:54Z | - |
dc.date.available | 2012-06-26T06:05:54Z | - |
dc.date.issued | 2011 | en_US |
dc.identifier.citation | Thin-walled Structures, 2011, v. 49 n. 10, p. 1334-1340 | en_US |
dc.identifier.issn | 0263-8231 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/150582 | - |
dc.description.abstract | A total of 62 single shear bolted connection specimens were tested using transient state test method. The specimens of single shear bolted connections were fabricated by three different thicknesses of thin sheet steels. The tests were conducted at three different load levels of 25%, 50% and 75% of the failure load at ambient temperature. The tendency of the test strength reduction of the single shear bolted connections conducted using the transient state test method is generally similar to that for the steady state test method. However, it is shown that the transient state test results are always conservative compared with the steady state test results. Three main failure modes, namely the bearing, tear out and net section tension, were observed in the transient state tests. The failure modes of the specimens in transient state tests for the load level of 0.25 of the failure load at ambient temperature are generally consistent with those specimens in the steady state tests. © 2011 Elsevier Ltd. All rights reserved. | en_US |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/tws | en_US |
dc.relation.ispartof | Thin-walled Structures | en_US |
dc.subject | Bolted connections | en_US |
dc.subject | Elevated temperature | en_US |
dc.subject | Thin sheet | en_US |
dc.subject | Transient state test | en_US |
dc.subject | Ultimate strength | en_US |
dc.title | Tests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state tests | en_US |
dc.type | Article | en_US |
dc.identifier.email | Young, B: young@hku.hk | en_US |
dc.identifier.authority | Young, B=rp00208 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1016/j.tws.2011.05.012 | en_US |
dc.identifier.scopus | eid_2-s2.0-79960918040 | en_US |
dc.identifier.hkuros | 209533 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-79960918040&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 49 | en_US |
dc.identifier.issue | 10 | en_US |
dc.identifier.spage | 1334 | en_US |
dc.identifier.epage | 1340 | en_US |
dc.identifier.isi | WOS:000294573600015 | - |
dc.publisher.place | United Kingdom | en_US |
dc.identifier.scopusauthorid | Young, B=7402192398 | en_US |
dc.identifier.scopusauthorid | Yan, S=37016814300 | en_US |
dc.identifier.citeulike | 9485209 | - |
dc.identifier.issnl | 0263-8231 | - |