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Article: Tests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state tests

TitleTests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state tests
Authors
KeywordsBolted connections
Elevated temperature
Thin sheet
Transient state test
Ultimate strength
Issue Date2011
PublisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/tws
Citation
Thin-walled Structures, 2011, v. 49 n. 10, p. 1334-1340 How to Cite?
AbstractA total of 62 single shear bolted connection specimens were tested using transient state test method. The specimens of single shear bolted connections were fabricated by three different thicknesses of thin sheet steels. The tests were conducted at three different load levels of 25%, 50% and 75% of the failure load at ambient temperature. The tendency of the test strength reduction of the single shear bolted connections conducted using the transient state test method is generally similar to that for the steady state test method. However, it is shown that the transient state test results are always conservative compared with the steady state test results. Three main failure modes, namely the bearing, tear out and net section tension, were observed in the transient state tests. The failure modes of the specimens in transient state tests for the load level of 0.25 of the failure load at ambient temperature are generally consistent with those specimens in the steady state tests. © 2011 Elsevier Ltd. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/150582
ISSN
2015 Impact Factor: 2.063
2015 SCImago Journal Rankings: 1.647
ISI Accession Number ID
Funding AgencyGrant Number
University of Hong Kong
Funding Information:

The authors are grateful to BlueScope Lysaght (Singapore) Pte Ltd for providing the thin sheet steels. The research work described in this paper was supported by a grant from The University of Hong Kong under the seed funding program for basic research.

References

 

DC FieldValueLanguage
dc.contributor.authorYan, Sen_US
dc.contributor.authorYoung, Ben_US
dc.date.accessioned2012-06-26T06:05:54Z-
dc.date.available2012-06-26T06:05:54Z-
dc.date.issued2011en_US
dc.identifier.citationThin-walled Structures, 2011, v. 49 n. 10, p. 1334-1340en_US
dc.identifier.issn0263-8231en_US
dc.identifier.urihttp://hdl.handle.net/10722/150582-
dc.description.abstractA total of 62 single shear bolted connection specimens were tested using transient state test method. The specimens of single shear bolted connections were fabricated by three different thicknesses of thin sheet steels. The tests were conducted at three different load levels of 25%, 50% and 75% of the failure load at ambient temperature. The tendency of the test strength reduction of the single shear bolted connections conducted using the transient state test method is generally similar to that for the steady state test method. However, it is shown that the transient state test results are always conservative compared with the steady state test results. Three main failure modes, namely the bearing, tear out and net section tension, were observed in the transient state tests. The failure modes of the specimens in transient state tests for the load level of 0.25 of the failure load at ambient temperature are generally consistent with those specimens in the steady state tests. © 2011 Elsevier Ltd. All rights reserved.en_US
dc.languageengen_US
dc.publisherPergamon. The Journal's web site is located at http://www.elsevier.com/locate/twsen_US
dc.relation.ispartofThin-walled Structuresen_US
dc.subjectBolted connectionsen_US
dc.subjectElevated temperatureen_US
dc.subjectThin sheeten_US
dc.subjectTransient state testen_US
dc.subjectUltimate strengthen_US
dc.titleTests of single shear bolted connections of thin sheet steels at elevated temperatures - part II: transient state testsen_US
dc.typeArticleen_US
dc.identifier.emailYoung, B: young@hku.hken_US
dc.identifier.authorityYoung, B=rp00208en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/j.tws.2011.05.012en_US
dc.identifier.scopuseid_2-s2.0-79960918040en_US
dc.identifier.hkuros209533-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-79960918040&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume49en_US
dc.identifier.issue10en_US
dc.identifier.spage1334en_US
dc.identifier.epage1340en_US
dc.identifier.isiWOS:000294573600015-
dc.publisher.placeUnited Kingdomen_US
dc.identifier.scopusauthoridYoung, B=7402192398en_US
dc.identifier.scopusauthoridYan, S=37016814300en_US
dc.identifier.citeulike9485209-

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