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Article: Replica technique for microcrack observation of rocks

TitleReplica technique for microcrack observation of rocks
一種用于巖石材料微裂紋觀察的復型技術
Authors
Keywords復型技術 (Replica technique)
微裂紋觀察 (Microcrack observation0
礦物破壞 (Mineral failure)
巖石 (Rock)
Issue Date2002
Citation
Chinese Journal of Rock Mechanics And Engineering, 2002, v. 21 n. 6, p. 797-802 How to Cite?
AbstractA special surface replica technique for microcrack observation of rocks is introduced. The replica, which is hard, thick and semi-transparent, is convenient to be used for observation and analysis under optical microscope and SEM (Scanning Electron Microscope). By using this technique, cracks wider than 0.2 μm and the microstructural natures of minerals can be satisfactorily copied for the microscopical investigation. The noticeable characteristic of this replica attributes to its capacity of distinguishing the minerals on the rock surface. Application of this technique in the study on failure behavior of different minerals in granite shows that this is an effective and convenient method for the study of microcracking in rocks, especially for the study of cracking behaviors of different minerals and their relations with the failure of the rocks.
介紹了一種用于巖石材料微裂紋觀察的復型技術。這種半透明的試樣表面復型可有效復制寬度大于0.2 mm的微觀裂紋以及礦物顆粒的微結構特征,并可方便地用于光學顯微鏡和掃描電鏡下觀察。它的最大特點是不僅能精確復制巖樣的表面裂紋,同時還能提供足夠多的信息以鑒別礦物顆粒。應用表明:對于巖石材料的微破裂研究,特別對于礦物顆粒的破壞行為與巖石破壞的關系研究,它是一種方便而有效的方法。
Persistent Identifierhttp://hdl.handle.net/10722/150218
ISSN
2015 SCImago Journal Rankings: 1.073
References

 

DC FieldValueLanguage
dc.contributor.authorLi, Len_US
dc.contributor.authorLee, PKKen_US
dc.contributor.authorTsui, Yen_US
dc.contributor.authorTham, LGen_US
dc.date.accessioned2012-06-26T06:02:28Z-
dc.date.available2012-06-26T06:02:28Z-
dc.date.issued2002en_US
dc.identifier.citationChinese Journal of Rock Mechanics And Engineering, 2002, v. 21 n. 6, p. 797-802en_US
dc.identifier.issn1000-6915en_US
dc.identifier.urihttp://hdl.handle.net/10722/150218-
dc.description.abstractA special surface replica technique for microcrack observation of rocks is introduced. The replica, which is hard, thick and semi-transparent, is convenient to be used for observation and analysis under optical microscope and SEM (Scanning Electron Microscope). By using this technique, cracks wider than 0.2 μm and the microstructural natures of minerals can be satisfactorily copied for the microscopical investigation. The noticeable characteristic of this replica attributes to its capacity of distinguishing the minerals on the rock surface. Application of this technique in the study on failure behavior of different minerals in granite shows that this is an effective and convenient method for the study of microcracking in rocks, especially for the study of cracking behaviors of different minerals and their relations with the failure of the rocks.en_US
dc.description.abstract介紹了一種用于巖石材料微裂紋觀察的復型技術。這種半透明的試樣表面復型可有效復制寬度大于0.2 mm的微觀裂紋以及礦物顆粒的微結構特征,并可方便地用于光學顯微鏡和掃描電鏡下觀察。它的最大特點是不僅能精確復制巖樣的表面裂紋,同時還能提供足夠多的信息以鑒別礦物顆粒。應用表明:對于巖石材料的微破裂研究,特別對于礦物顆粒的破壞行為與巖石破壞的關系研究,它是一種方便而有效的方法。-
dc.languagechien_US
dc.relation.ispartofChinese Journal of Rock Mechanics and Engineeringen_US
dc.relation.ispartof巖石力學與工程學報 (Yanshilixue Yu Gongcheng Xuebao)-
dc.subject復型技術 (Replica technique)-
dc.subject微裂紋觀察 (Microcrack observation0-
dc.subject礦物破壞 (Mineral failure)-
dc.subject巖石 (Rock)-
dc.titleReplica technique for microcrack observation of rocksen_US
dc.title一種用于巖石材料微裂紋觀察的復型技術-
dc.typeArticleen_US
dc.identifier.emailLee, PKK: hreclkk@hkucc.hku.hken_US
dc.identifier.emailTham, LG: hrectlg@hkucc.hku.hken_US
dc.identifier.authorityLee, PKK=rp00141en_US
dc.identifier.authorityTham, LG=rp00176en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0036592888en_US
dc.identifier.hkuros67346-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0036592888&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume21en_US
dc.identifier.issue6en_US
dc.identifier.spage797en_US
dc.identifier.epage802en_US
dc.publisher.placeChinaen_US
dc.identifier.scopusauthoridLi, L=26642937600en_US
dc.identifier.scopusauthoridLee, PKK=24522826500en_US
dc.identifier.scopusauthoridTsui, Y=7006760586en_US
dc.identifier.scopusauthoridTham, LG=7006213628en_US

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