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Article: Quantification of bacterial adhesion forces using atomic force microscopy (AFM)

TitleQuantification of bacterial adhesion forces using atomic force microscopy (AFM)
Authors
KeywordsAdhesion force
Atomic force microscopy (AFM)
Bacteria
Cell
Elasticity
Extracellular polymer substance (EPS)
Issue Date2000
PublisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jmicmeth
Citation
Journal Of Microbiological Methods, 2000, v. 40 n. 1, p. 89-97 How to Cite?
AbstractThis study demonstrated that atomic force microscopy (AFM) can be used to obtain high-resolution topographical images of bacteria, and to quantify the tip-cell interaction force and the surface elasticity. Results show that the adhesion force between the Si3N4 tip and the bacteria surface was in the range from -3.9 to -4.3 nN. On the other hand, the adhesion forces at the periphery of the cell-substratum contact surface ranged from -5.1 to -5.9 nN and those at the cell-cell interface ranged from -6.5 to -6.8 nN. The two latter forces were considerably greater than the former one, most likely due to the accumulation of extracellular polymer substance (EPS). Results also show that the elasticity varied on the cell surface. (C) 2000 Elsevier Science B.V.
Persistent Identifierhttp://hdl.handle.net/10722/150153
ISSN
2015 Impact Factor: 1.857
2015 SCImago Journal Rankings: 0.805
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorFang, HHPen_US
dc.contributor.authorChan, KYen_US
dc.contributor.authorXu, LCen_US
dc.date.accessioned2012-06-26T06:01:52Z-
dc.date.available2012-06-26T06:01:52Z-
dc.date.issued2000en_US
dc.identifier.citationJournal Of Microbiological Methods, 2000, v. 40 n. 1, p. 89-97en_US
dc.identifier.issn0167-7012en_US
dc.identifier.urihttp://hdl.handle.net/10722/150153-
dc.description.abstractThis study demonstrated that atomic force microscopy (AFM) can be used to obtain high-resolution topographical images of bacteria, and to quantify the tip-cell interaction force and the surface elasticity. Results show that the adhesion force between the Si3N4 tip and the bacteria surface was in the range from -3.9 to -4.3 nN. On the other hand, the adhesion forces at the periphery of the cell-substratum contact surface ranged from -5.1 to -5.9 nN and those at the cell-cell interface ranged from -6.5 to -6.8 nN. The two latter forces were considerably greater than the former one, most likely due to the accumulation of extracellular polymer substance (EPS). Results also show that the elasticity varied on the cell surface. (C) 2000 Elsevier Science B.V.en_US
dc.languageengen_US
dc.publisherElsevier BV. The Journal's web site is located at http://www.elsevier.com/locate/jmicmethen_US
dc.relation.ispartofJournal of Microbiological Methodsen_US
dc.rightsJournal of Microbiological Methods. Copyright © Elsevier BV.-
dc.subjectAdhesion force-
dc.subjectAtomic force microscopy (AFM)-
dc.subjectBacteria-
dc.subjectCell-
dc.subjectElasticity-
dc.subjectExtracellular polymer substance (EPS)-
dc.subject.meshAluminum Silicatesen_US
dc.subject.meshBacterial Adhesionen_US
dc.subject.meshBiofilms - Growth & Developmenten_US
dc.subject.meshElasticityen_US
dc.subject.meshGeologic Sediments - Microbiologyen_US
dc.subject.meshMicroscopy, Atomic Force - Methodsen_US
dc.subject.meshPolymers - Metabolismen_US
dc.subject.meshSeawater - Microbiologyen_US
dc.subject.meshSulfur-Reducing Bacteria - Isolation & Purification - Physiology - Ultrastructureen_US
dc.subject.meshSurface Propertiesen_US
dc.titleQuantification of bacterial adhesion forces using atomic force microscopy (AFM)en_US
dc.typeArticleen_US
dc.identifier.emailFang, HHP:hrechef@hkucc.hku.hken_US
dc.identifier.emailChan, KY:hrsccky@hku.hken_US
dc.identifier.authorityFang, HHP=rp00115en_US
dc.identifier.authorityChan, KY=rp00662en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1016/S0167-7012(99)00137-2en_US
dc.identifier.pmid10739347-
dc.identifier.scopuseid_2-s2.0-0033968812en_US
dc.identifier.hkuros51631-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-0033968812&selection=ref&src=s&origin=recordpageen_US
dc.identifier.volume40en_US
dc.identifier.issue1en_US
dc.identifier.spage89en_US
dc.identifier.epage97en_US
dc.identifier.isiWOS:000085845300011-
dc.publisher.placeNetherlandsen_US
dc.identifier.scopusauthoridFang, HHP=7402542625en_US
dc.identifier.scopusauthoridChan, KY=7406034142en_US
dc.identifier.scopusauthoridXu, LC=8505464800en_US
dc.identifier.citeulike4021661-

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