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Article: Fractal two-level finite element method for cracked Kirchhoff's plates using DKT elements
Title | Fractal two-level finite element method for cracked Kirchhoff's plates using DKT elements |
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Authors | |
Issue Date | 1996 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/engfracmech |
Citation | Engineering Fracture Mechanics, 1996, v. 54 n. 5, p. 703-711 How to Cite? |
Abstract | A technique for calculating moment intensity factors (MIF) and stress intensity factors (SIF) for through-thickness cracks in thin plates subjected to out-of-plane bending by means of fractal two-level finite element method is proposed. It is based on the nodal displacements transformation near the crack tip in terms of some analytical functions. The similarity characteristic properties of the plate element stiffness are employed. Fractal transformation technique is developed to transform infinitely many nodal displacements around the crack tip to a small set of generalized displacements including the MIF and SIF as direct unknowns. Examples are given on the centre cracked plates in bending. The results are in good agreement with analytical results and with other researchers. Comparison of the results from Kirchhoffs theory and from Reissner's plate theory shows large differences up to ca 50%. Copyright © 1996 Elsevier Science Ltd. |
Persistent Identifier | http://hdl.handle.net/10722/150079 |
ISSN | 2023 Impact Factor: 4.7 2023 SCImago Journal Rankings: 1.232 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Leung, AYT | en_US |
dc.contributor.author | Su, RKL | en_US |
dc.date.accessioned | 2012-06-26T06:01:26Z | - |
dc.date.available | 2012-06-26T06:01:26Z | - |
dc.date.issued | 1996 | en_US |
dc.identifier.citation | Engineering Fracture Mechanics, 1996, v. 54 n. 5, p. 703-711 | en_US |
dc.identifier.issn | 0013-7944 | en_US |
dc.identifier.uri | http://hdl.handle.net/10722/150079 | - |
dc.description.abstract | A technique for calculating moment intensity factors (MIF) and stress intensity factors (SIF) for through-thickness cracks in thin plates subjected to out-of-plane bending by means of fractal two-level finite element method is proposed. It is based on the nodal displacements transformation near the crack tip in terms of some analytical functions. The similarity characteristic properties of the plate element stiffness are employed. Fractal transformation technique is developed to transform infinitely many nodal displacements around the crack tip to a small set of generalized displacements including the MIF and SIF as direct unknowns. Examples are given on the centre cracked plates in bending. The results are in good agreement with analytical results and with other researchers. Comparison of the results from Kirchhoffs theory and from Reissner's plate theory shows large differences up to ca 50%. Copyright © 1996 Elsevier Science Ltd. | en_US |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/engfracmech | en_US |
dc.relation.ispartof | Engineering Fracture Mechanics | en_US |
dc.title | Fractal two-level finite element method for cracked Kirchhoff's plates using DKT elements | en_US |
dc.type | Article | en_US |
dc.identifier.email | Su, RKL:klsu@hkucc.hku.hk | en_US |
dc.identifier.authority | Su, RKL=rp00072 | en_US |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1016/0013-7944(95)00203-0 | en_US |
dc.identifier.scopus | eid_2-s2.0-0030193472 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-0030193472&selection=ref&src=s&origin=recordpage | en_US |
dc.identifier.volume | 54 | en_US |
dc.identifier.issue | 5 | en_US |
dc.identifier.spage | 703 | en_US |
dc.identifier.epage | 711 | en_US |
dc.identifier.isi | WOS:A1996UV64100009 | - |
dc.publisher.place | United Kingdom | en_US |
dc.identifier.scopusauthorid | Leung, AYT=7403012697 | en_US |
dc.identifier.scopusauthorid | Su, RKL=7102627096 | en_US |
dc.identifier.issnl | 0013-7944 | - |