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Article: Buckling and vibration of thin, flat-walled structures continuous over several spans

TitleBuckling and vibration of thin, flat-walled structures continuous over several spans
Authors
Cheung, YKDelcourt, C
Issue Date1977
Citation
Proc Inst Civ Eng (Lond), 1977, v. 63 pt 2, p. 93-103 How to Cite?
AbstractThe finite strip method is applied to the stability and free vibration analysis of thin, flat-walled structures coninuous over several spans. The accuracy of the method is checked against known continuous beam results and the method is then applied to the analysis of a real structure. For the type of structures under consideration, the finite strip method is very economical in comparision with the standard finite element analysis.
Persistent Identifierhttp://hdl.handle.net/10722/149824

 

DC FieldValueLanguage
dc.contributor.authorCheung, YKen_US
dc.contributor.authorDelcourt, Cen_US
dc.date.accessioned2012-06-26T05:59:59Z-
dc.date.available2012-06-26T05:59:59Z-
dc.date.issued1977en_US
dc.identifier.citationProc Inst Civ Eng (Lond), 1977, v. 63 pt 2, p. 93-103en_US
dc.identifier.urihttp://hdl.handle.net/10722/149824-
dc.description.abstractThe finite strip method is applied to the stability and free vibration analysis of thin, flat-walled structures coninuous over several spans. The accuracy of the method is checked against known continuous beam results and the method is then applied to the analysis of a real structure. For the type of structures under consideration, the finite strip method is very economical in comparision with the standard finite element analysis.en_US
dc.languageengen_US
dc.relation.ispartofProc Inst Civ Eng (Lond)en_US
dc.titleBuckling and vibration of thin, flat-walled structures continuous over several spansen_US
dc.typeArticleen_US
dc.identifier.emailCheung, YK:hreccyk@hkucc.hku.hken_US
dc.identifier.authorityCheung, YK=rp00104en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.scopuseid_2-s2.0-0017468276en_US
dc.identifier.volume63en_US
dc.identifier.issuept 2en_US
dc.identifier.spage93en_US
dc.identifier.epage103en_US
dc.identifier.scopusauthoridCheung, YK=7202111065en_US
dc.identifier.scopusauthoridDelcourt, C=7003677379en_US

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