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Article: External learning, market dynamics, and radical innovation: Evidence from China's high-tech firms

TitleExternal learning, market dynamics, and radical innovation: Evidence from China's high-tech firms
Authors
Bao, YChen, XZhou, KZ
KeywordsAdministrative learning
Competitive intensity
External learning
Radical innovation
Technical learning
Technological turbulence
Issue Date2012
PublisherElsevier Inc. The Journal's web site is located at http://www.elsevier.com/locate/jbusres
Citation
Journal Of Business Research, 2012, v. 65 n. 8, p. 1226-1233 How to Cite?
DOI: http://dx.doi.org/10.1016/j.jbusres.2011.06.036
AbstractBased on a dichotomy of knowledge content, this study examines how two types of external learning (i.e. technical and administrative learning) affect radical innovation, and assesses how such effects are conditional on two types of market dynamics (i.e. technological turbulence and competitive intensity). A survey of 183 high-tech firms in China shows that both technical and administrative learning facilitate development of radical innovation. Further, technological turbulence . reduces the effect of technical learning but . enhances the effect of administrative learning on radical innovation, whereas competitive intensity . enhances the effect of technical learning but . reduces the effect of administrative learning on radical innovation. © 2011 Elsevier Inc..
Persistent Identifierhttp://hdl.handle.net/10722/149167
ISSN
0148-2963
2023 Impact Factor: 10.5
2023 SCImago Journal Rankings: 3.128
ISI Accession Number ID
WOS:000305847400022
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorBao, Yen_HK
dc.contributor.authorChen, Xen_HK
dc.contributor.authorZhou, KZen_HK
dc.date.accessioned2012-06-22T06:27:31Z-
dc.date.available2012-06-22T06:27:31Z-
dc.date.issued2012en_HK
dc.identifier.citationJournal Of Business Research, 2012, v. 65 n. 8, p. 1226-1233en_HK
dc.identifier.issn0148-2963en_HK
dc.identifier.urihttp://hdl.handle.net/10722/149167-
dc.description.abstractBased on a dichotomy of knowledge content, this study examines how two types of external learning (i.e. technical and administrative learning) affect radical innovation, and assesses how such effects are conditional on two types of market dynamics (i.e. technological turbulence and competitive intensity). A survey of 183 high-tech firms in China shows that both technical and administrative learning facilitate development of radical innovation. Further, technological turbulence . reduces the effect of technical learning but . enhances the effect of administrative learning on radical innovation, whereas competitive intensity . enhances the effect of technical learning but . reduces the effect of administrative learning on radical innovation. © 2011 Elsevier Inc..en_HK
dc.languageengen_US
dc.publisherElsevier Inc. The Journal's web site is located at http://www.elsevier.com/locate/jbusresen_HK
dc.relation.ispartofJournal of Business Researchen_HK
dc.subjectAdministrative learningen_HK
dc.subjectCompetitive intensityen_HK
dc.subjectExternal learningen_HK
dc.subjectRadical innovationen_HK
dc.subjectTechnical learningen_HK
dc.subjectTechnological turbulenceen_HK
dc.titleExternal learning, market dynamics, and radical innovation: Evidence from China's high-tech firmsen_HK
dc.typeArticleen_HK
dc.identifier.emailZhou, KZ: kevinz@hkucc.hku.hken_HK
dc.identifier.authorityZhou, KZ=rp01127en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.jbusres.2011.06.036en_HK
dc.identifier.scopuseid_2-s2.0-84861657158en_HK
dc.identifier.hkuros200135en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-84861657158&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume65en_HK
dc.identifier.issue8en_HK
dc.identifier.spage1226en_HK
dc.identifier.epage1233en_HK
dc.identifier.isiWOS:000305847400022-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridBao, Y=26025860200en_HK
dc.identifier.scopusauthoridChen, X=35075782200en_HK
dc.identifier.scopusauthoridZhou, KZ=7202914654en_HK
dc.identifier.citeulike9544715-
dc.identifier.issnl0148-2963-

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