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Article: A rapid method for reprocessing paraffin sections for diagnostic electron microscopy

TitleA rapid method for reprocessing paraffin sections for diagnostic electron microscopy
Authors
Issue Date1985
PublisherJohn Wiley & Sons. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1130
Citation
Journal Of Pathology, 1985, v. 145 n. 1, p. 59-62 How to Cite?
AbstractA rapid method for re-embedding paraffin sections into epoxy resin for diagnostic electron microscopy is described. The method requires a relatively shorter time than the traditional block retrieval technique and produces a reasonable quality of ultrastructure for diagnostic purposes.
Persistent Identifierhttp://hdl.handle.net/10722/147762
ISSN
2015 Impact Factor: 7.381
2015 SCImago Journal Rankings: 4.176
ISI Accession Number ID

 

DC FieldValueLanguage
dc.contributor.authorNgai, HKen_US
dc.contributor.authorChan, KWen_US
dc.contributor.authorOr, SBen_US
dc.contributor.authorYau, WLen_US
dc.date.accessioned2012-05-29T06:09:06Z-
dc.date.available2012-05-29T06:09:06Z-
dc.date.issued1985en_US
dc.identifier.citationJournal Of Pathology, 1985, v. 145 n. 1, p. 59-62en_US
dc.identifier.issn0022-3417en_US
dc.identifier.urihttp://hdl.handle.net/10722/147762-
dc.description.abstractA rapid method for re-embedding paraffin sections into epoxy resin for diagnostic electron microscopy is described. The method requires a relatively shorter time than the traditional block retrieval technique and produces a reasonable quality of ultrastructure for diagnostic purposes.en_US
dc.languageengen_US
dc.publisherJohn Wiley & Sons. The Journal's web site is located at http://www3.interscience.wiley.com/cgi-bin/jhome/1130en_US
dc.relation.ispartofJournal of Pathologyen_US
dc.subject.meshCarcinoma, Squamous Cell - Ultrastructureen_US
dc.subject.meshHistological Techniquesen_US
dc.subject.meshHumansen_US
dc.subject.meshMicroscopy, Electron - Methodsen_US
dc.subject.meshParaffinen_US
dc.titleA rapid method for reprocessing paraffin sections for diagnostic electron microscopyen_US
dc.typeArticleen_US
dc.identifier.emailChan, KW:hrmtckw@hku.hken_US
dc.identifier.authorityChan, KW=rp00330en_US
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1002/path.1711450106-
dc.identifier.pmid3881578en_US
dc.identifier.scopuseid_2-s2.0-0021968272en_US
dc.identifier.volume145en_US
dc.identifier.issue1en_US
dc.identifier.spage59en_US
dc.identifier.epage62en_US
dc.identifier.isiWOS:A1985AAV8000005-
dc.publisher.placeUnited Kingdomen_US

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