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Article: Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film
Title | Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film |
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Authors | |
Keywords | Antiferromagnetic materials Crystalline materials Iron compounds Light polarization Magnetic storage |
Issue Date | 2005 |
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ |
Citation | Applied Physics Letters, 2005, v. 86 n. 12, article no. 122504 How to Cite? |
Abstract | Polarization dependent x-ray photoemission electron microscopy was used to investigate the influence of the exchange bias coupling on the disordered ultrathin single-crystalline fcc Fe50 Mn50. We find that the critical thickness of the FeMn film, where the antiferromagnetic (AF) order is formed, varies with changing the magnetization direction of the ferromagnetic (FM) layer from out-of-plane to in-plane. Surface magneto-optical Kerr effect measurements (SMOKE) further manifest the shift of the critical thickness with alternating the exchange bias coupling. It indicates that the spin structure of the FeMn layer near the FM layer is modified by the presence of exchange bias coupling and the properties of the coupling. Our results provide direct experimental evidence that the AF spin structure at the interface between the FM and AF layers is strongly influenced by the exchange bias coupling. © 2005 American Institute of Physics. |
Persistent Identifier | http://hdl.handle.net/10722/146334 |
ISSN | 2021 Impact Factor: 3.971 2020 SCImago Journal Rankings: 1.182 |
ISI Accession Number ID |
DC Field | Value | Language |
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dc.contributor.author | Wang, J | - |
dc.contributor.author | Kuch, W | - |
dc.contributor.author | Chelaru, LI | - |
dc.contributor.author | Offi, F | - |
dc.contributor.author | Kotsugi, M | - |
dc.date.accessioned | 2012-04-19T06:30:16Z | - |
dc.date.available | 2012-04-19T06:30:16Z | - |
dc.date.issued | 2005 | - |
dc.identifier.citation | Applied Physics Letters, 2005, v. 86 n. 12, article no. 122504 | - |
dc.identifier.issn | 0003-6951 | - |
dc.identifier.uri | http://hdl.handle.net/10722/146334 | - |
dc.description.abstract | Polarization dependent x-ray photoemission electron microscopy was used to investigate the influence of the exchange bias coupling on the disordered ultrathin single-crystalline fcc Fe50 Mn50. We find that the critical thickness of the FeMn film, where the antiferromagnetic (AF) order is formed, varies with changing the magnetization direction of the ferromagnetic (FM) layer from out-of-plane to in-plane. Surface magneto-optical Kerr effect measurements (SMOKE) further manifest the shift of the critical thickness with alternating the exchange bias coupling. It indicates that the spin structure of the FeMn layer near the FM layer is modified by the presence of exchange bias coupling and the properties of the coupling. Our results provide direct experimental evidence that the AF spin structure at the interface between the FM and AF layers is strongly influenced by the exchange bias coupling. © 2005 American Institute of Physics. | - |
dc.language | eng | - |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | - |
dc.relation.ispartof | Applied Physics Letters | - |
dc.rights | Copyright 2005 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters, 2005, v. 86 n. 12, article no. 122504 and may be found at https://doi.org/10.1063/1.1883318 | - |
dc.subject | Antiferromagnetic materials | - |
dc.subject | Crystalline materials | - |
dc.subject | Iron compounds | - |
dc.subject | Light polarization | - |
dc.subject | Magnetic storage | - |
dc.title | Influence of exchange bias coupling on the single-crystalline FeMn ultrathin film | en_US |
dc.type | Article | en_US |
dc.identifier.email | Wang, J: jianwang@hku.hk | - |
dc.description.nature | published_or_final_version | - |
dc.identifier.doi | 10.1063/1.1883318 | - |
dc.identifier.scopus | eid_2-s2.0-17944368491 | - |
dc.identifier.hkuros | 121668 | - |
dc.identifier.volume | 86 | - |
dc.identifier.issue | 12 | - |
dc.identifier.spage | article no. 122504 | - |
dc.identifier.epage | article no. 122504 | - |
dc.identifier.isi | WOS:000228050900052 | - |
dc.publisher.place | United States | - |
dc.identifier.issnl | 0003-6951 | - |