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Article: Fault localization based only on failed runs
Title | Fault localization based only on failed runs |
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Authors | |
Keywords | Computing in asia Failed test cases Fault localization Software debugging |
Issue Date | 2012 |
Publisher | IEEE, Computer Society. The Journal's web site is located at http://www.computer.org/computer |
Citation | Computer, 2012, v. 45 n. 6, p. 64-71 How to Cite? |
Abstract | Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE. |
Persistent Identifier | http://hdl.handle.net/10722/146031 |
ISSN | 2023 Impact Factor: 2.0 2023 SCImago Journal Rankings: 0.803 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
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dc.contributor.author | Zhang, Z | - |
dc.contributor.author | Chan, WK | - |
dc.contributor.author | Tse, TH | - |
dc.date.accessioned | 2012-03-27T09:07:20Z | - |
dc.date.available | 2012-03-27T09:07:20Z | - |
dc.date.issued | 2012 | - |
dc.identifier.citation | Computer, 2012, v. 45 n. 6, p. 64-71 | - |
dc.identifier.issn | 0018-9162 | - |
dc.identifier.uri | http://hdl.handle.net/10722/146031 | - |
dc.description.abstract | Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE. | - |
dc.language | eng | - |
dc.publisher | IEEE, Computer Society. The Journal's web site is located at http://www.computer.org/computer | - |
dc.relation.ispartof | Computer | - |
dc.rights | Computer (New York). Copyright © IEEE, Computer Society. | - |
dc.rights | ©2012 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. | - |
dc.subject | Computing in asia | - |
dc.subject | Failed test cases | - |
dc.subject | Fault localization | - |
dc.subject | Software debugging | - |
dc.title | Fault localization based only on failed runs | - |
dc.type | Article | - |
dc.identifier.email | Zhang, Z: zhangzy@ios.ac.cn | - |
dc.identifier.email | Chan, WK: rickchan@hkucc.hku.hk | - |
dc.identifier.email | Tse, TH: thtse@cs.hku.hk | - |
dc.identifier.authority | Tse, TH=rp00546 | - |
dc.description.nature | postprint | - |
dc.identifier.doi | 10.1109/MC.2012.185 | - |
dc.identifier.scopus | eid_2-s2.0-84863426736 | en_HK |
dc.identifier.hkuros | 198832 | - |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-84863426736&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 45 | - |
dc.identifier.issue | 6 | - |
dc.identifier.spage | 64 | - |
dc.identifier.epage | 71 | - |
dc.identifier.isi | WOS:000305314600016 | - |
dc.publisher.place | United States | - |
dc.identifier.scopusauthorid | Zhang, Z=10639502200 | en_HK |
dc.identifier.scopusauthorid | Chan, WK=23967779900 | en_HK |
dc.identifier.scopusauthorid | Tse, TH=7005496974 | en_HK |
dc.identifier.issnl | 0018-9162 | - |