Article: Fault localization based only on failed runs
| Title | Fault localization based only on failed runs |
|---|---|
| Authors | Zhang, Z3 Chan, WK2 Tse, TH1 |
| Keywords | Computing in Asia Failed test cases Fault localization Software debugging |
| Issue Date | 2012 |
| Publisher | I E E E, Computer Society. The Journal's web site is located at http://www.computer.org/computer |
| Citation | Computer, 2012, v. 45 n. 6, p. 64-71 [How to Cite?] DOI: http://dx.doi.org/10.1109/MC.2012.185 |
| Abstract | Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE. |
| ISSN | 0018-9162 2011 Impact Factor: 1.47 |
| DOI | http://dx.doi.org/10.1109/MC.2012.185 |
| References | References in Scopus |
| dc.contributor.author | Zhang, Z |
|---|---|
| dc.contributor.author | Chan, WK |
| dc.contributor.author | Tse, TH |
| dc.date.accessioned | 2012-03-27T09:07:20Z |
| dc.date.available | 2012-03-27T09:07:20Z |
| dc.date.issued | 2012 |
| dc.description.abstract | Fault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE. |
| dc.description.nature | published_or_final_version |
| dc.identifier.citation | Computer, 2012, v. 45 n. 6, p. 64-71 [How to Cite?] DOI: http://dx.doi.org/10.1109/MC.2012.185 |
| dc.identifier.doi | http://dx.doi.org/10.1109/MC.2012.185 |
| dc.identifier.epage | 71 |
| dc.identifier.hkuros | 198832 |
| dc.identifier.issn | 0018-9162 2011 Impact Factor: 1.47 |
| dc.identifier.issue | 6 |
| dc.identifier.scopus | eid_2-s2.0-84863426736 |
| dc.identifier.spage | 64 |
| dc.identifier.uri | http://hdl.handle.net/10722/146031 |
| dc.identifier.volume | 45 |
| dc.language | eng |
| dc.publisher | I E E E, Computer Society. The Journal's web site is located at http://www.computer.org/computer |
| dc.publisher.place | United States |
| dc.relation.ispartof | Computer |
| dc.relation.references | References in Scopus |
| dc.rights | Computer (New York). Copyright © IEEE, Computer Society. |
| dc.rights | ©2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| dc.rights | Creative Commons: Attribution 3.0 Hong Kong License |
| dc.subject | Computing in Asia |
| dc.subject | Failed test cases |
| dc.subject | Fault localization |
| dc.subject | Software debugging |
| dc.title | Fault localization based only on failed runs |
| dc.type | Article |
Author Affiliations
- The University of Hong Kong
- City University of Hong Kong
- Chinese Academy of Sciences

