Article: Fault localization based only on failed runs

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TitleFault localization based only on failed runs
AuthorsZhang, Z3
Chan, WK2
Tse, TH1
KeywordsComputing in Asia
Failed test cases
Fault localization
Software debugging
Issue Date2012
PublisherI E E E, Computer Society. The Journal's web site is located at http://www.computer.org/computer
CitationComputer, 2012, v. 45 n. 6, p. 64-71 [How to Cite?]
DOI: http://dx.doi.org/10.1109/MC.2012.185
AbstractFault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE.
ISSN0018-9162
2011 Impact Factor: 1.47
DOIhttp://dx.doi.org/10.1109/MC.2012.185
ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorZhang, Z
dc.contributor.authorChan, WK
dc.contributor.authorTse, TH
dc.date.accessioned2012-03-27T09:07:20Z
dc.date.available2012-03-27T09:07:20Z
dc.date.issued2012
dc.description.abstractFault localization commonly relies on both passed and failed runs, but passed runs are generally susceptible to coincidental correctness and modern software automatically produces a huge number of bug reports on failed runs. FOnly is an effective new technique that relies only on failed runs to locate faults statistically. © 2012 IEEE.
dc.description.naturepublished_or_final_version
dc.identifier.citationComputer, 2012, v. 45 n. 6, p. 64-71 [How to Cite?]
DOI: http://dx.doi.org/10.1109/MC.2012.185
dc.identifier.doihttp://dx.doi.org/10.1109/MC.2012.185
dc.identifier.epage71
dc.identifier.hkuros198832
dc.identifier.issn0018-9162
2011 Impact Factor: 1.47
dc.identifier.issue6
dc.identifier.scopuseid_2-s2.0-84863426736
dc.identifier.spage64
dc.identifier.urihttp://hdl.handle.net/10722/146031
dc.identifier.volume45
dc.languageeng
dc.publisherI E E E, Computer Society. The Journal's web site is located at http://www.computer.org/computer
dc.publisher.placeUnited States
dc.relation.ispartofComputer
dc.relation.referencesReferences in Scopus
dc.rightsComputer (New York). Copyright © IEEE, Computer Society.
dc.rights©2012 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License
dc.subjectComputing in Asia
dc.subjectFailed test cases
dc.subjectFault localization
dc.subjectSoftware debugging
dc.titleFault localization based only on failed runs
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong
  2. City University of Hong Kong
  3. Chinese Academy of Sciences