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- Publisher Website: 10.1364/OE.18.000931
- Scopus: eid_2-s2.0-75249090178
- PMID: 20173915
- WOS: WOS:000273860400057
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Article: Solar-blind deep-UV band-pass filter (250-350 nm) consisting of a metal nano-grid fabricated by nanoimprint lithography
Title | Solar-blind deep-UV band-pass filter (250-350 nm) consisting of a metal nano-grid fabricated by nanoimprint lithography |
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Authors | |
Issue Date | 2010 |
Publisher | Optical Society of America. The Journal's web site is located at http://www.opticsexpress.org |
Citation | Optics Express, 2010, v. 18 n. 2, p. 931-937 How to Cite? |
Abstract | We designed, fabricated and demonstrated a solar-blind deep-UV pass filter, that has a measured optical performance of a 27% transmission peak at 290 nm, a pass-band width of 100 nm (from 250 to 350 nm), and a 20dB rejection ratio between deep-UV wavelength and visible wavelength. The filter consists of an aluminum nano-grid, which was made by coating 20 nm Al on a SiO2 square grid with 190 nm pitch, 30 nm linewidth and 250 nm depth. The performances agree with a rigorous coupled wave analysis. The wavelength for the peak transmission and the pass-bandwidth can be tuned through adjusting the metal nano-grid dimensions. The filter was fabricated by nanoimprint lithography, hence is large area and low cost. Combining with Si photodetectors, the filter offers simple yet effective and low cost solar-blind deep-UV detection at either a single device or large-area complex integrated imaging array level. © 2010 Optical Society of America. |
Persistent Identifier | http://hdl.handle.net/10722/145474 |
ISSN | 2023 Impact Factor: 3.2 2023 SCImago Journal Rankings: 0.998 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Li, WD | en_HK |
dc.contributor.author | Chou, SY | en_HK |
dc.date.accessioned | 2012-02-23T12:10:53Z | - |
dc.date.available | 2012-02-23T12:10:53Z | - |
dc.date.issued | 2010 | en_HK |
dc.identifier.citation | Optics Express, 2010, v. 18 n. 2, p. 931-937 | en_HK |
dc.identifier.issn | 1094-4087 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/145474 | - |
dc.description.abstract | We designed, fabricated and demonstrated a solar-blind deep-UV pass filter, that has a measured optical performance of a 27% transmission peak at 290 nm, a pass-band width of 100 nm (from 250 to 350 nm), and a 20dB rejection ratio between deep-UV wavelength and visible wavelength. The filter consists of an aluminum nano-grid, which was made by coating 20 nm Al on a SiO2 square grid with 190 nm pitch, 30 nm linewidth and 250 nm depth. The performances agree with a rigorous coupled wave analysis. The wavelength for the peak transmission and the pass-bandwidth can be tuned through adjusting the metal nano-grid dimensions. The filter was fabricated by nanoimprint lithography, hence is large area and low cost. Combining with Si photodetectors, the filter offers simple yet effective and low cost solar-blind deep-UV detection at either a single device or large-area complex integrated imaging array level. © 2010 Optical Society of America. | en_HK |
dc.language | eng | en_US |
dc.publisher | Optical Society of America. The Journal's web site is located at http://www.opticsexpress.org | en_HK |
dc.relation.ispartof | Optics Express | en_HK |
dc.subject.mesh | Aluminum - chemistry | en_HK |
dc.subject.mesh | Equipment Design | en_HK |
dc.subject.mesh | Equipment Failure Analysis | en_HK |
dc.subject.mesh | Filtration - instrumentation | en_HK |
dc.subject.mesh | Nanostructures - chemistry - ultrastructure | en_HK |
dc.subject.mesh | Nanotechnology - instrumentation | en_HK |
dc.subject.mesh | Optical Devices | en_HK |
dc.subject.mesh | Photography - methods | en_HK |
dc.subject.mesh | Refractometry - instrumentation | en_HK |
dc.subject.mesh | Silicon Dioxide - chemistry | en_HK |
dc.subject.mesh | Solar Energy | en_HK |
dc.subject.mesh | Ultraviolet Rays | en_HK |
dc.title | Solar-blind deep-UV band-pass filter (250-350 nm) consisting of a metal nano-grid fabricated by nanoimprint lithography | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Li, WD:liwd@hku.hk | en_HK |
dc.identifier.authority | Li, WD=rp01581 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1364/OE.18.000931 | en_HK |
dc.identifier.pmid | 20173915 | - |
dc.identifier.scopus | eid_2-s2.0-75249090178 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-75249090178&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 18 | en_HK |
dc.identifier.issue | 2 | en_HK |
dc.identifier.spage | 931 | en_HK |
dc.identifier.epage | 937 | en_HK |
dc.identifier.eissn | 1094-4087 | - |
dc.identifier.isi | WOS:000273860400057 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Li, WD=35181575900 | en_HK |
dc.identifier.scopusauthorid | Chou, SY=7401538612 | en_HK |
dc.identifier.issnl | 1094-4087 | - |