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Conference Paper: 100 nm metallic checkerboard by wafer-scale nanoimprint and its application in surface enhanced Raman spectroscopy
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Title100 nm metallic checkerboard by wafer-scale nanoimprint and its application in surface enhanced Raman spectroscopy
 
AuthorsLi, WD1
Wang, C1
Chou, SY1
 
KeywordsRaman Spectroscopy
 
Issue Date2010
 
CitationLasers And Electro-Optics/Quantum Electronics And Laser Science Conference: 2010 Laser Science To Photonic Applications, Cleo/Qels 2010, 2010 [How to Cite?]
 
AbstractA wafer-scale (∼4 inch) 100 nm nano-checkerboard structure was fabricated. The fabrication combines multiple nanoimprint lithography, 3-D patterning and self-aligned etching. Transmission/reflection resonance at ∼750 nm and Raman enhancement of ∼ 4.5∼10 6 were achieved. © 2010 Optical Society of America.
 
ReferencesReferences in Scopus
 
DC FieldValue
dc.contributor.authorLi, WD
 
dc.contributor.authorWang, C
 
dc.contributor.authorChou, SY
 
dc.date.accessioned2012-02-23T12:10:52Z
 
dc.date.available2012-02-23T12:10:52Z
 
dc.date.issued2010
 
dc.description.abstractA wafer-scale (∼4 inch) 100 nm nano-checkerboard structure was fabricated. The fabrication combines multiple nanoimprint lithography, 3-D patterning and self-aligned etching. Transmission/reflection resonance at ∼750 nm and Raman enhancement of ∼ 4.5∼10 6 were achieved. © 2010 Optical Society of America.
 
dc.description.natureLink_to_subscribed_fulltext
 
dc.identifier.citationLasers And Electro-Optics/Quantum Electronics And Laser Science Conference: 2010 Laser Science To Photonic Applications, Cleo/Qels 2010, 2010 [How to Cite?]
 
dc.identifier.scopuseid_2-s2.0-77957594761
 
dc.identifier.urihttp://hdl.handle.net/10722/145471
 
dc.languageeng
 
dc.relation.ispartofLasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010
 
dc.relation.referencesReferences in Scopus
 
dc.subjectRaman Spectroscopy
 
dc.title100 nm metallic checkerboard by wafer-scale nanoimprint and its application in surface enhanced Raman spectroscopy
 
dc.typeConference_Paper
 
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Author Affiliations
  1. Princeton University