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- Publisher Website: 10.1016/j.apradiso.2006.08.006
- Scopus: eid_2-s2.0-33845762787
- PMID: 17029818
- WOS: WOS:000244021000007
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Article: Derivation of V function for LR 115 SSNTD from its sensitivity to 220Rn in a diffusion chamber
Title | Derivation of V function for LR 115 SSNTD from its sensitivity to 220Rn in a diffusion chamber |
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Authors | |
Keywords | Bulk etch Diffusion chamber LR 115 detector Solid-state nuclear track detector Track etch |
Issue Date | 2007 |
Publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/apradiso |
Citation | Applied Radiation And Isotopes, 2007, v. 65 n. 3, p. 313-317 How to Cite? |
Abstract | The sensitivity of the LR 115 detector inside a diffusion chamber to 220Rn gas concentration is dependent on the removed active layer thickness during chemical etching. This dependence is related to the V function for the LR 115 detector (where V is the ratio between the track etch velocity V t and the bulk etch velocity V b) and the geometry of the diffusion chamber. The present paper presents the experimentally determined relationship between the sensitivity of the LR 115 detector inside a Karlsruhe diffusion chamber (determined from the number of etched tracks completely penetrating the active cellulose nitrate layer) and the removed active layer thickness. These data were used to derive the V function for the LR 115 detector, which took the functional form of the Durrani-Green's function, i.e., V = 1 + (a 1 e - a2 R + a 3 e - a4 R) (1 - e - a5 R), with the best-fitted constants as a 1 = 14.50, a 2 = 0.50, a 3 = 3.9 and a 4 = 0.066. © 2006 Elsevier Ltd. All rights reserved. |
Persistent Identifier | http://hdl.handle.net/10722/143783 |
ISSN | 2023 Impact Factor: 1.6 2023 SCImago Journal Rankings: 0.389 |
ISI Accession Number ID | |
References |
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Leung, SYY | en_HK |
dc.contributor.author | Nikezic, D | en_HK |
dc.contributor.author | Leung, JKC | en_HK |
dc.contributor.author | Yu, KN | en_HK |
dc.date.accessioned | 2011-12-21T08:55:13Z | - |
dc.date.available | 2011-12-21T08:55:13Z | - |
dc.date.issued | 2007 | en_HK |
dc.identifier.citation | Applied Radiation And Isotopes, 2007, v. 65 n. 3, p. 313-317 | en_HK |
dc.identifier.issn | 0969-8043 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/143783 | - |
dc.description.abstract | The sensitivity of the LR 115 detector inside a diffusion chamber to 220Rn gas concentration is dependent on the removed active layer thickness during chemical etching. This dependence is related to the V function for the LR 115 detector (where V is the ratio between the track etch velocity V t and the bulk etch velocity V b) and the geometry of the diffusion chamber. The present paper presents the experimentally determined relationship between the sensitivity of the LR 115 detector inside a Karlsruhe diffusion chamber (determined from the number of etched tracks completely penetrating the active cellulose nitrate layer) and the removed active layer thickness. These data were used to derive the V function for the LR 115 detector, which took the functional form of the Durrani-Green's function, i.e., V = 1 + (a 1 e - a2 R + a 3 e - a4 R) (1 - e - a5 R), with the best-fitted constants as a 1 = 14.50, a 2 = 0.50, a 3 = 3.9 and a 4 = 0.066. © 2006 Elsevier Ltd. All rights reserved. | en_HK |
dc.language | eng | en_US |
dc.publisher | Pergamon. The Journal's web site is located at http://www.elsevier.com/locate/apradiso | en_HK |
dc.relation.ispartof | Applied Radiation and Isotopes | en_HK |
dc.subject | Bulk etch | en_HK |
dc.subject | Diffusion chamber | en_HK |
dc.subject | LR 115 detector | en_HK |
dc.subject | Solid-state nuclear track detector | en_HK |
dc.subject | Track etch | en_HK |
dc.title | Derivation of V function for LR 115 SSNTD from its sensitivity to 220Rn in a diffusion chamber | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Leung, JKC: jkcleung@hku.hk | en_HK |
dc.identifier.authority | Leung, JKC=rp00732 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | - |
dc.identifier.doi | 10.1016/j.apradiso.2006.08.006 | en_HK |
dc.identifier.pmid | 17029818 | - |
dc.identifier.scopus | eid_2-s2.0-33845762787 | en_HK |
dc.identifier.hkuros | 198152 | en_US |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-33845762787&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 65 | en_HK |
dc.identifier.issue | 3 | en_HK |
dc.identifier.spage | 313 | en_HK |
dc.identifier.epage | 317 | en_HK |
dc.identifier.isi | WOS:000244021000007 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Leung, SYY=55168680800 | en_HK |
dc.identifier.scopusauthorid | Nikezic, D=35614145500 | en_HK |
dc.identifier.scopusauthorid | Leung, JKC=24080627200 | en_HK |
dc.identifier.scopusauthorid | Yu, KN=7403385896 | en_HK |
dc.identifier.issnl | 0969-8043 | - |