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Article: Genome-wide association: Practical application of current technology to overcome multiple testing

TitleGenome-wide association: Practical application of current technology to overcome multiple testing
Authors
Neale, BMCherny, SSSham, PC
Issue Date2005
PublisherWiley
Citation
XIII World Congress of Psychiatric Genetics, 2005. In American Journal of Medical Genetics Part B: Neuropsychiatric Genetics, 2005, v. 138B, p. 19-20 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/143670
ISSN
1552-485X
2023 Impact Factor: 1.6
2023 SCImago Journal Rankings: 1.228

 

DC FieldValueLanguage
dc.contributor.authorNeale, BMen_US
dc.contributor.authorCherny, SSen_US
dc.contributor.authorSham, PCen_US
dc.date.accessioned2011-12-16T08:09:19Z-
dc.date.available2011-12-16T08:09:19Z-
dc.date.issued2005en_US
dc.identifier.citationXIII World Congress of Psychiatric Genetics, 2005. In American Journal of Medical Genetics Part B: Neuropsychiatric Genetics, 2005, v. 138B, p. 19-20en_US
dc.identifier.issn1552-485X-
dc.identifier.urihttp://hdl.handle.net/10722/143670-
dc.publisherWiley-
dc.relation.ispartofAmerican Journal of Medical Genetics Part B: Neuropsychiatric Geneticsen_US
dc.titleGenome-wide association: Practical application of current technology to overcome multiple testingen_US
dc.typeArticleen_US
dc.identifier.emailCherny, SS: cherny@hku.hken_US
dc.identifier.authorityCherny, SS=rp00232en_US
dc.identifier.volume138Ben_US
dc.identifier.spage19en_US
dc.identifier.epage20en_US
dc.identifier.issnl1552-4841-

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