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Article: Genome-wide association: Practical application of current technology to overcome multiple testing

TitleGenome-wide association: Practical application of current technology to overcome multiple testing
Authors
Issue Date2005
PublisherWiley
Citation
XIII World Congress of Psychiatric Genetics, 2005. In American Journal of Medical Genetics Part B: Neuropsychiatric Genetics, 2005, v. 138B, p. 19-20 How to Cite?
Persistent Identifierhttp://hdl.handle.net/10722/143670
ISSN
2015 SCImago Journal Rankings: 1.771

 

DC FieldValueLanguage
dc.contributor.authorNeale, BMen_US
dc.contributor.authorCherny, SSen_US
dc.contributor.authorSham, PCen_US
dc.date.accessioned2011-12-16T08:09:19Z-
dc.date.available2011-12-16T08:09:19Z-
dc.date.issued2005en_US
dc.identifier.citationXIII World Congress of Psychiatric Genetics, 2005. In American Journal of Medical Genetics Part B: Neuropsychiatric Genetics, 2005, v. 138B, p. 19-20en_US
dc.identifier.issn1552-485X-
dc.identifier.urihttp://hdl.handle.net/10722/143670-
dc.publisherWiley-
dc.relation.ispartofAmerican Journal of Medical Genetics Part B: Neuropsychiatric Geneticsen_US
dc.titleGenome-wide association: Practical application of current technology to overcome multiple testingen_US
dc.typeArticleen_US
dc.identifier.emailCherny, SS: cherny@hku.hken_US
dc.identifier.authorityCherny, SS=rp00232en_US
dc.identifier.volume138Ben_US
dc.identifier.spage19en_US
dc.identifier.epage20en_US

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