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Article: Annealing study of titanium oxide nanotube arrays

TitleAnnealing study of titanium oxide nanotube arrays
Authors
KeywordsAnnealing
Defects
Nanostructures
Positron annihilation spectroscopy
Issue Date2011
PublisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/matchemphys
Citation
Materials Chemistry And Physics, 2011, v. 130 n. 3, p. 1227-1231 How to Cite?
AbstractTitanium dioxide nanotube arrays fabricated by anodization of titanium foil and annealed at different temperatures were studied using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and positron annihilation spectroscopy (PAS). The crystallization process and morphological changes of the nanotubes have been discussed. It was found that anatase (1 0 1) only appeared on the walls of the nanotubes. The atomic concentration of fluoride and the ratio of Ti/O decreased when the annealing temperature increased. Vacancy type defects were found to diffuse toward the surface when the samples were annealed at 200 °C and 400 °C and healing of vacancies occurred at 600 °C. In addition, fluoride may form some complexes with vacancies on the surface hence lowering the value of S parameter. © 2011 Elsevier B.V. All rights reserved.
Persistent Identifierhttp://hdl.handle.net/10722/143381
ISSN
2015 Impact Factor: 2.101
2015 SCImago Journal Rankings: 0.733
ISI Accession Number ID
Funding AgencyGrant Number
Research Grant Council of the Hong Kong Special Administrative Region, ChinaHKU7021/10P
Funding Information:

The work described in this paper is supported by the GRF grant from the Research Grant Council of the Hong Kong Special Administrative Region, China (under project no. HKU7021/10P).

References

 

DC FieldValueLanguage
dc.contributor.authorYang, Ben_HK
dc.contributor.authorNg, CKen_HK
dc.contributor.authorFung, MKen_HK
dc.contributor.authorLing, CCen_HK
dc.contributor.authorDjurišić, ABen_HK
dc.contributor.authorFung, Sen_HK
dc.date.accessioned2011-11-24T10:04:42Z-
dc.date.available2011-11-24T10:04:42Z-
dc.date.issued2011en_HK
dc.identifier.citationMaterials Chemistry And Physics, 2011, v. 130 n. 3, p. 1227-1231en_HK
dc.identifier.issn0254-0584en_HK
dc.identifier.urihttp://hdl.handle.net/10722/143381-
dc.description.abstractTitanium dioxide nanotube arrays fabricated by anodization of titanium foil and annealed at different temperatures were studied using X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), scanning electron microscopy (SEM) and positron annihilation spectroscopy (PAS). The crystallization process and morphological changes of the nanotubes have been discussed. It was found that anatase (1 0 1) only appeared on the walls of the nanotubes. The atomic concentration of fluoride and the ratio of Ti/O decreased when the annealing temperature increased. Vacancy type defects were found to diffuse toward the surface when the samples were annealed at 200 °C and 400 °C and healing of vacancies occurred at 600 °C. In addition, fluoride may form some complexes with vacancies on the surface hence lowering the value of S parameter. © 2011 Elsevier B.V. All rights reserved.en_HK
dc.languageengen_US
dc.publisherElsevier SA. The Journal's web site is located at http://www.elsevier.com/locate/matchemphysen_HK
dc.relation.ispartofMaterials Chemistry and Physicsen_HK
dc.subjectAnnealingen_HK
dc.subjectDefectsen_HK
dc.subjectNanostructuresen_HK
dc.subjectPositron annihilation spectroscopyen_HK
dc.titleAnnealing study of titanium oxide nanotube arraysen_HK
dc.typeArticleen_HK
dc.identifier.emailLing, CC: ccling@hkucc.hku.hken_HK
dc.identifier.emailDjurišić, AB: dalek@hku.hken_HK
dc.identifier.emailFung, S: sfung@hku.hken_HK
dc.identifier.authorityLing, CC=rp00747en_HK
dc.identifier.authorityDjurišić, AB=rp00690en_HK
dc.identifier.authorityFung, S=rp00695en_HK
dc.description.naturelink_to_subscribed_fulltext-
dc.identifier.doi10.1016/j.matchemphys.2011.08.063en_HK
dc.identifier.scopuseid_2-s2.0-80054030649en_HK
dc.identifier.hkuros197739en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-80054030649&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume130en_HK
dc.identifier.issue3en_HK
dc.identifier.spage1227en_HK
dc.identifier.epage1231en_HK
dc.identifier.isiWOS:000296830500062-
dc.publisher.placeSwitzerlanden_HK
dc.identifier.scopusauthoridYang, B=7404472939en_HK
dc.identifier.scopusauthoridNg, CK=39861750400en_HK
dc.identifier.scopusauthoridFung, MK=35191896100en_HK
dc.identifier.scopusauthoridLing, CC=13310239300en_HK
dc.identifier.scopusauthoridDjurišić, AB=7004904830en_HK
dc.identifier.scopusauthoridFung, S=7201970040en_HK
dc.identifier.citeulike9841257-

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