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Article: Upper bound for block-error rate of S-T codes

TitleUpper bound for block-error rate of S-T codes
Authors
KeywordsBit Error Rate
Error Analysis
Probability
Signal To Noise Ratio
Issue Date2007
PublisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/EL
Citation
Electronics Letters, 2007, v. 43 n. 2, p. 116-117 How to Cite?
AbstractA novel upper bound is proposed using correct probability for evaluation of block-error rate of space-time codes at low signal-to-noise ratio. Analytical and numerical results show that, at low SNR, the proposed bound is tighter and more accurate than that of the Union Bound using the pair-wise error probability. © The Institution of Engineering and Technology 2007.
Persistent Identifierhttp://hdl.handle.net/10722/143335
ISSN
2015 Impact Factor: 0.854
2015 SCImago Journal Rankings: 0.549
ISI Accession Number ID
References

 

DC FieldValueLanguage
dc.contributor.authorZhang, Zen_HK
dc.contributor.authorCheung, SWen_HK
dc.contributor.authorYuk, TIen_HK
dc.date.accessioned2011-11-22T08:30:44Z-
dc.date.available2011-11-22T08:30:44Z-
dc.date.issued2007en_HK
dc.identifier.citationElectronics Letters, 2007, v. 43 n. 2, p. 116-117en_HK
dc.identifier.issn0013-5194en_HK
dc.identifier.urihttp://hdl.handle.net/10722/143335-
dc.description.abstractA novel upper bound is proposed using correct probability for evaluation of block-error rate of space-time codes at low signal-to-noise ratio. Analytical and numerical results show that, at low SNR, the proposed bound is tighter and more accurate than that of the Union Bound using the pair-wise error probability. © The Institution of Engineering and Technology 2007.-
dc.languageengen_US
dc.publisherThe Institution of Engineering and Technology. The Journal's web site is located at http://www.ieedl.org/ELen_HK
dc.relation.ispartofElectronics Lettersen_HK
dc.subjectBit Error Rateen_US
dc.subjectError Analysisen_US
dc.subjectProbabilityen_US
dc.subjectSignal To Noise Ratioen_US
dc.titleUpper bound for block-error rate of S-T codesen_HK
dc.typeArticleen_HK
dc.identifier.emailCheung, SW:swcheung@eee.hku.hken_HK
dc.identifier.emailYuk, TI:tiyuk@eee.hku.hken_HK
dc.identifier.authorityCheung, SW=rp00102en_HK
dc.identifier.authorityYuk, TI=rp00210en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1049/el:20073177en_HK
dc.identifier.scopuseid_2-s2.0-33846622046en_HK
dc.identifier.hkuros151307-
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-33846622046&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume43en_HK
dc.identifier.issue2en_HK
dc.identifier.spage116en_HK
dc.identifier.epage117en_HK
dc.identifier.isiWOS:000248317300033-
dc.publisher.placeUnited Kingdomen_HK
dc.identifier.scopusauthoridZhang, Z=8407277900en_HK
dc.identifier.scopusauthoridCheung, SW=7202472784en_HK
dc.identifier.scopusauthoridYuk, TI=6603685705en_HK

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