Conference Paper: On infectious models for dependent default risk
| Title | On infectious models for dependent default risk |
|---|---|
| Authors | Gu, J1 Ching, WK1 Siu, TK2 |
| Keywords | Chain reaction of infectious defaults Common shock Default risk Markov chains One-sector model Two-sector model |
| Issue Date | 2011 |
| Publisher | IEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1002829 |
| Citation | The 4th International Joint Conference on Computational Sciences and Optimization (CSO 2011), Yunnan, China, 15-19 April 2011. In Proceedings of the 4th CSO, 2011, p. 1196-1200 [How to Cite?] DOI: http://dx.doi.org/10.1109/CSO.2011.185 |
| Abstract | Modeling dependent defaults is a key issue in risk measurement and management. In this paper, we introduce a Markovian infectious model to describe the dependent relationship of default processes of credit entities. The key idea of the proposed model is based on the concept of common shocks adopted in the insurance industry. We compare the proposed model to both one-sector and two-sector models considered in the credit literature using real default data. A log-likelihood ratio test is applied to compare the goodness-of- fit of the proposed model. Our empirical results reveal that the proposed model outperforms both the one-sector and two-sector models. © 2011 IEEE. |
| ISBN | 978-0-7695-4335-2 |
| DOI | http://dx.doi.org/10.1109/CSO.2011.185 |
| References | References in Scopus |
| dc.contributor.author | Gu, J |
|---|---|
| dc.contributor.author | Ching, WK |
| dc.contributor.author | Siu, TK |
| dc.date.accessioned | 2011-10-28T02:56:23Z |
| dc.date.available | 2011-10-28T02:56:23Z |
| dc.date.issued | 2011 |
| dc.description.abstract | Modeling dependent defaults is a key issue in risk measurement and management. In this paper, we introduce a Markovian infectious model to describe the dependent relationship of default processes of credit entities. The key idea of the proposed model is based on the concept of common shocks adopted in the insurance industry. We compare the proposed model to both one-sector and two-sector models considered in the credit literature using real default data. A log-likelihood ratio test is applied to compare the goodness-of- fit of the proposed model. Our empirical results reveal that the proposed model outperforms both the one-sector and two-sector models. © 2011 IEEE. |
| dc.description.nature | published_or_final_version |
| dc.description.other | The 4th International Joint Conference on Computational Sciences and Optimization (CSO 2011), Yunnan, China, 15-19 April 2011. In Proceedings of the 4th CSO, 2011, p. 1196-1200 |
| dc.identifier.citation | The 4th International Joint Conference on Computational Sciences and Optimization (CSO 2011), Yunnan, China, 15-19 April 2011. In Proceedings of the 4th CSO, 2011, p. 1196-1200 [How to Cite?] DOI: http://dx.doi.org/10.1109/CSO.2011.185 |
| dc.identifier.doi | http://dx.doi.org/10.1109/CSO.2011.185 |
| dc.identifier.epage | 1200 |
| dc.identifier.hkuros | 184625 |
| dc.identifier.isbn | 978-0-7695-4335-2 |
| dc.identifier.scopus | eid_2-s2.0-80052006093 |
| dc.identifier.spage | 1196 |
| dc.identifier.uri | http://hdl.handle.net/10722/142832 |
| dc.language | eng |
| dc.publisher | IEEE Computer Society. The Journal's web site is located at http://ieeexplore.ieee.org/xpl/conhome.jsp?punumber=1002829 |
| dc.relation.ispartof | Proceedings of the International Joint Conference on Computational Sciences and Optimization, CSO 2011 |
| dc.relation.references | References in Scopus |
| dc.rights | Creative Commons: Attribution 3.0 Hong Kong License |
| dc.rights | Proceedings of the International Joint Conference on Computational Sciences and Optimization. Copyright © IEEE Computer Society. |
| dc.rights | ©2011 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE. |
| dc.subject | Chain reaction of infectious defaults |
| dc.subject | Common shock |
| dc.subject | Default risk |
| dc.subject | Markov chains |
| dc.subject | One-sector model |
| dc.subject | Two-sector model |
| dc.title | On infectious models for dependent default risk |
| dc.type | Conference_Paper |
Author Affiliations
- The University of Hong Kong
- Macquarie University

