Article: A two-terminal write-once-read-many-times-memory device based on an aluminum nitride thin film containing al nanocrystals

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TitleA two-terminal write-once-read-many-times-memory device based on an aluminum nitride thin film containing al nanocrystals
AuthorsLiu, Y2
Chen, TP3
Ding, L3
Li, YB4
Zhang, S3
Fung, S1
KeywordsMemory
Nanocrystal
WORM
Issue Date2010
PublisherAmerican Scientific Publishers. The Journal's web site is located at http://aspbs.com/jnn/
CitationJournal Of Nanoscience And Nanotechnology, 2010, v. 10 n. 9, p. 5796-5799 [How to Cite?]
DOI: http://dx.doi.org/10.1166/jnn.2010.2440
AbstractA switching from a high-conduction state to a low-conduction state occurs in an AIN thin film containing Al nanocrystals (nc-AI) when the nc-AI is charged with electrons. The switching is explained in terms of breaking of the conductive percolation paths of the nc-AI as a result of the charging of the nc-AI. A write-once-read many times-memory (WORM) device is demonstrated based on this phenomenon. The device can be switched by charging the nc-AI with a voltage of +10 V for 100 ms, yielding a current ratio of the two memory states of more than 300 at the reading voltage of 1 V. The charged state (i.e., the low-conduction state) remains unchanged after more than 1 x 106 read cycles, and its retention time is predicted to be more than 10 years. © 2010 American.
ISSN1533-4880
2011 Impact Factor: 1.563
2011 SCImago Journal Rankings: 0.087
DOIhttp://dx.doi.org/10.1166/jnn.2010.2440
ISI Accession Number IDWOS:000279836400039
Funding AgencyGrant Number
NSFC60806040
National Research Foundation of SingaporeNRF-G-CRP 2007-01
Funding Information:

This work has been financially supported by NSFC under project No.60806040 and the National Research Foundation of Singapore under project No. NRF-G-CRP 2007-01.

ReferencesReferences in Scopus
DC Field
Value
dc.contributor.authorLiu, Y
dc.contributor.authorChen, TP
dc.contributor.authorDing, L
dc.contributor.authorLi, YB
dc.contributor.authorZhang, S
dc.contributor.authorFung, S
dc.date.accessioned2011-10-28T02:46:40Z
dc.date.available2011-10-28T02:46:40Z
dc.date.issued2010
dc.description.abstractA switching from a high-conduction state to a low-conduction state occurs in an AIN thin film containing Al nanocrystals (nc-AI) when the nc-AI is charged with electrons. The switching is explained in terms of breaking of the conductive percolation paths of the nc-AI as a result of the charging of the nc-AI. A write-once-read many times-memory (WORM) device is demonstrated based on this phenomenon. The device can be switched by charging the nc-AI with a voltage of +10 V for 100 ms, yielding a current ratio of the two memory states of more than 300 at the reading voltage of 1 V. The charged state (i.e., the low-conduction state) remains unchanged after more than 1 x 106 read cycles, and its retention time is predicted to be more than 10 years. © 2010 American.
dc.description.natureLink_to_subscribed_fulltext
dc.identifier.citationJournal Of Nanoscience And Nanotechnology, 2010, v. 10 n. 9, p. 5796-5799 [How to Cite?]
DOI: http://dx.doi.org/10.1166/jnn.2010.2440
dc.identifier.doihttp://dx.doi.org/10.1166/jnn.2010.2440
dc.identifier.epage5799
dc.identifier.hkuros184559
dc.identifier.isiWOS:000279836400039
Funding AgencyGrant Number
NSFC60806040
National Research Foundation of SingaporeNRF-G-CRP 2007-01
Funding Information:

This work has been financially supported by NSFC under project No.60806040 and the National Research Foundation of Singapore under project No. NRF-G-CRP 2007-01.

dc.identifier.issn1533-4880
2011 Impact Factor: 1.563
2011 SCImago Journal Rankings: 0.087
dc.identifier.issue9
dc.identifier.pmid21133107
dc.identifier.scopuseid_2-s2.0-79952726380
dc.identifier.spage5796
dc.identifier.urihttp://hdl.handle.net/10722/142460
dc.identifier.volume10
dc.languageeng
dc.publisherAmerican Scientific Publishers. The Journal's web site is located at http://aspbs.com/jnn/
dc.publisher.placeUnited States
dc.relation.ispartofJournal of Nanoscience and Nanotechnology
dc.relation.referencesReferences in Scopus
dc.subjectMemory
dc.subjectNanocrystal
dc.subjectWORM
dc.titleA two-terminal write-once-read-many-times-memory device based on an aluminum nitride thin film containing al nanocrystals
dc.typeArticle
Author Affiliations
  1. The University of Hong Kong
  2. University of Electronic Science and Technology of China
  3. Nanyang Technological University
  4. Harbin Institute of Technology