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Conference Paper: Thermal characterization of organic light emitting devices

TitleThermal characterization of organic light emitting devices
Authors
Chan, PKL
KeywordsDegradation
Issue Date2009
Citation
14Th Optoelectronics And Communications Conference, Oecc 2009 How to Cite?
DOI: http://dx.doi.org/10.1109/OECC.2009.5213782
AbstractCCD-based thermoreflectance is applied on organinc light emitting devices to investigate the temperaure distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism. © 2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/141704
References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorChan, PKLen_HK
dc.date.accessioned2011-09-27T02:58:20Z-
dc.date.available2011-09-27T02:58:20Z-
dc.date.issued2009en_HK
dc.identifier.citation14Th Optoelectronics And Communications Conference, Oecc 2009en_HK
dc.identifier.urihttp://hdl.handle.net/10722/141704-
dc.description.abstractCCD-based thermoreflectance is applied on organinc light emitting devices to investigate the temperaure distribution along the device surface under different bias conditions. This technique can provide useful information on understanding the device degradation mechanism. © 2009 IEEE.en_HK
dc.languageengen_US
dc.relation.ispartof2009 14th OptoElectronics and Communications Conference, OECC 2009en_HK
dc.subjectDegradationen_US
dc.titleThermal characterization of organic light emitting devicesen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailChan, PKL:pklc@hku.hken_HK
dc.identifier.authorityChan, PKL=rp01532en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1109/OECC.2009.5213782en_HK
dc.identifier.scopuseid_2-s2.0-70350729478en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-70350729478&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.scopusauthoridChan, PKL=35742829700en_HK

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