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Article: Theoretical and experimental studies on the electric impedance of active piezoelectric sensors bonded on cracked beams
Title | Theoretical and experimental studies on the electric impedance of active piezoelectric sensors bonded on cracked beams | ||||||||
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Authors | |||||||||
Keywords | Crack Propagation Electric Impedance Electric Impedance Measurement Electric Sensing Devices Piezoelectric Transducers Piezoelectricity Structural Health Monitoring | ||||||||
Issue Date | 2010 | ||||||||
Publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/sms | ||||||||
Citation | Smart Materials And Structures, 2010, v. 19 n. 4 How to Cite? | ||||||||
Abstract | The electric impedance of symmetrically surface-bonded piezoelectric sensors on a cracked beam is studied. To investigate the effect of the crack on the electric impedance in a convenient fashion, an analytical expression is derived that is correlated to the physical parameters of the crack and the host beam. The beam segment covered with piezoelectric patches and the cracked region are regarded as a bimorph segment and an equivalent spring, respectively, and the entire beam system is then represented by three elastic beam segments and a bimorph segment together with the spring. Electric impedance experiments are also conducted for uncracked beams and for cracked beams with single-edge or double-edge cracks. The experimental results agree with those generated by the analytical expression. The crack depth has little effect on the corresponding mode frequency for cracks located at the mode node of a beam. For cracks located away from the mode node, the corresponding mode frequency decreases as the crack depth increases. Moreover, the closer the crack to the anti-node of the mode, the greater the decrease in the corresponding mode frequency. The mechanism of these changes is discussed. The findings should prove helpful for structural health monitoring using active piezoelectric sensors. © IOP Publishing Ltd. | ||||||||
Persistent Identifier | http://hdl.handle.net/10722/141701 | ||||||||
ISSN | 2023 Impact Factor: 3.7 2023 SCImago Journal Rankings: 0.872 | ||||||||
ISI Accession Number ID |
Funding Information: The work described in this paper was supported by the Hong Kong Polytechnic University (Project No: G-YX2J), the Research Grants Council of the Hong Kong Special Administrative Region (Project No: CityU 113809), and the Natural Science Foundation of China (Project No: 10902041). | ||||||||
References |
DC Field | Value | Language |
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dc.contributor.author | Kuang, YD | en_HK |
dc.contributor.author | Shi, SQ | en_HK |
dc.contributor.author | Chan, PKL | en_HK |
dc.contributor.author | He, XQ | en_HK |
dc.contributor.author | Chen, CY | en_HK |
dc.date.accessioned | 2011-09-27T02:58:18Z | - |
dc.date.available | 2011-09-27T02:58:18Z | - |
dc.date.issued | 2010 | en_HK |
dc.identifier.citation | Smart Materials And Structures, 2010, v. 19 n. 4 | en_HK |
dc.identifier.issn | 0964-1726 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/141701 | - |
dc.description.abstract | The electric impedance of symmetrically surface-bonded piezoelectric sensors on a cracked beam is studied. To investigate the effect of the crack on the electric impedance in a convenient fashion, an analytical expression is derived that is correlated to the physical parameters of the crack and the host beam. The beam segment covered with piezoelectric patches and the cracked region are regarded as a bimorph segment and an equivalent spring, respectively, and the entire beam system is then represented by three elastic beam segments and a bimorph segment together with the spring. Electric impedance experiments are also conducted for uncracked beams and for cracked beams with single-edge or double-edge cracks. The experimental results agree with those generated by the analytical expression. The crack depth has little effect on the corresponding mode frequency for cracks located at the mode node of a beam. For cracks located away from the mode node, the corresponding mode frequency decreases as the crack depth increases. Moreover, the closer the crack to the anti-node of the mode, the greater the decrease in the corresponding mode frequency. The mechanism of these changes is discussed. The findings should prove helpful for structural health monitoring using active piezoelectric sensors. © IOP Publishing Ltd. | en_HK |
dc.language | eng | en_US |
dc.publisher | Institute of Physics Publishing. The Journal's web site is located at http://www.iop.org/journals/sms | en_HK |
dc.relation.ispartof | Smart Materials and Structures | en_HK |
dc.subject | Crack Propagation | en_US |
dc.subject | Electric Impedance | en_US |
dc.subject | Electric Impedance Measurement | en_US |
dc.subject | Electric Sensing Devices | en_US |
dc.subject | Piezoelectric Transducers | en_US |
dc.subject | Piezoelectricity | en_US |
dc.subject | Structural Health Monitoring | en_US |
dc.title | Theoretical and experimental studies on the electric impedance of active piezoelectric sensors bonded on cracked beams | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Chan, PKL:pklc@hku.hk | en_HK |
dc.identifier.authority | Chan, PKL=rp01532 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1088/0964-1726/19/4/045021 | en_HK |
dc.identifier.scopus | eid_2-s2.0-77949898862 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-77949898862&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 19 | en_HK |
dc.identifier.issue | 4 | en_HK |
dc.identifier.eissn | 1361-665X | - |
dc.identifier.isi | WOS:000275842000021 | - |
dc.publisher.place | United Kingdom | en_HK |
dc.identifier.scopusauthorid | Kuang, YD=25644718300 | en_HK |
dc.identifier.scopusauthorid | Shi, SQ=7402200920 | en_HK |
dc.identifier.scopusauthorid | Chan, PKL=35742829700 | en_HK |
dc.identifier.scopusauthorid | He, XQ=14031368000 | en_HK |
dc.identifier.scopusauthorid | Chen, CY=7501955518 | en_HK |
dc.identifier.issnl | 0964-1726 | - |