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Article: Nonvolatile organic transistor-memory devices using various thicknesses of silver nanoparticle layers
Title | Nonvolatile organic transistor-memory devices using various thicknesses of silver nanoparticle layers | ||||||
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Authors | |||||||
Keywords | Carrier Transport Nanoparticles Semiconducting Organic Compounds Semiconductor Devices | ||||||
Issue Date | 2010 | ||||||
Publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | ||||||
Citation | Applied Physics Letters, 2010, v. 97 n. 2, article no. 023511 How to Cite? | ||||||
Abstract | We demonstrate the modification of the memory effect in organic memory devices by adjusting the thickness of silver nanoparticles (NPs) layer embedded into the organic semiconductor. The memory window widens with increasing Ag NPs layer thickness, a maximum window of 90 V is achieved for 5 nm Ag NPs and the on/off current ratio decreases from 105 to 10 when the Ag NPs layer thickness increases from 1 to 10 nm. We also compare the charge retention properties of the devices with different Ag NPs thicknesses. Our investigation presents a direct approach to optimize the performance of organic memory with the current structure. © 2010 American Institute of Physics. | ||||||
Persistent Identifier | http://hdl.handle.net/10722/141697 | ||||||
ISSN | 2023 Impact Factor: 3.5 2023 SCImago Journal Rankings: 0.976 | ||||||
ISI Accession Number ID |
Funding Information: This work was supported by research grants (Grant Nos. 1-ZV43, 1-ZV4H, and A-PJ73) from Hong Kong Polytechnic University. Funding from HKSAR through UGC grant (Grant No. PolyU 5112/08E) is also acknowledged. | ||||||
References |
DC Field | Value | Language |
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dc.contributor.author | Wang, SM | en_HK |
dc.contributor.author | Leung, CW | en_HK |
dc.contributor.author | Chan, PKL | en_HK |
dc.date.accessioned | 2011-09-27T02:58:17Z | - |
dc.date.available | 2011-09-27T02:58:17Z | - |
dc.date.issued | 2010 | en_HK |
dc.identifier.citation | Applied Physics Letters, 2010, v. 97 n. 2, article no. 023511 | - |
dc.identifier.issn | 0003-6951 | en_HK |
dc.identifier.uri | http://hdl.handle.net/10722/141697 | - |
dc.description.abstract | We demonstrate the modification of the memory effect in organic memory devices by adjusting the thickness of silver nanoparticles (NPs) layer embedded into the organic semiconductor. The memory window widens with increasing Ag NPs layer thickness, a maximum window of 90 V is achieved for 5 nm Ag NPs and the on/off current ratio decreases from 105 to 10 when the Ag NPs layer thickness increases from 1 to 10 nm. We also compare the charge retention properties of the devices with different Ag NPs thicknesses. Our investigation presents a direct approach to optimize the performance of organic memory with the current structure. © 2010 American Institute of Physics. | en_HK |
dc.language | eng | en_US |
dc.publisher | American Institute of Physics. The Journal's web site is located at http://apl.aip.org/ | en_HK |
dc.relation.ispartof | Applied Physics Letters | en_HK |
dc.subject | Carrier Transport | en_US |
dc.subject | Nanoparticles | en_US |
dc.subject | Semiconducting Organic Compounds | en_US |
dc.subject | Semiconductor Devices | en_US |
dc.title | Nonvolatile organic transistor-memory devices using various thicknesses of silver nanoparticle layers | en_HK |
dc.type | Article | en_HK |
dc.identifier.email | Chan, PKL:pklc@hku.hk | en_HK |
dc.identifier.authority | Chan, PKL=rp01532 | en_HK |
dc.description.nature | link_to_subscribed_fulltext | en_US |
dc.identifier.doi | 10.1063/1.3462949 | en_HK |
dc.identifier.scopus | eid_2-s2.0-77955162739 | en_HK |
dc.relation.references | http://www.scopus.com/mlt/select.url?eid=2-s2.0-77955162739&selection=ref&src=s&origin=recordpage | en_HK |
dc.identifier.volume | 97 | en_HK |
dc.identifier.issue | 2 | en_HK |
dc.identifier.spage | article no. 023511 | - |
dc.identifier.epage | article no. 023511 | - |
dc.identifier.isi | WOS:000279999800085 | - |
dc.publisher.place | United States | en_HK |
dc.identifier.scopusauthorid | Wang, SM=35093369400 | en_HK |
dc.identifier.scopusauthorid | Leung, CW=22958301300 | en_HK |
dc.identifier.scopusauthorid | Chan, PKL=35742829700 | en_HK |
dc.identifier.issnl | 0003-6951 | - |