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Article: Intermolecular electronic coupling in organic molecular thin films measured by temperature modulation spectroscopy

TitleIntermolecular electronic coupling in organic molecular thin films measured by temperature modulation spectroscopy
Authors
Yadav, AJin, YChan, PKLShtein, MPipe, KP
KeywordsCharge Transfer
Decay (Organic)
Excitons
Ion Exchange
Molecular Spectroscopy
Temperature Distribution
Thin Films
Issue Date2010
PublisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/
Citation
Applied Physics Letters, 2010, v. 97 n. 20, article no. 203307 How to Cite?
DOI: http://dx.doi.org/10.1063/1.3516040
AbstractTemperature modulation spectroscopy is used to obtain the temperature dependences of oscillator strength, exciton transition energy, and linewidth for a copper phthalocyanine thin film. With increasing temperature, the oscillator strength exhibits a pronounced decrease for charge transfer (CT) excitons, making this technique suitable for differentiating exciton types. From the measured magnitude and temperature dependence of the CT oscillator strength, we obtain estimates for the intermolecular electronic coupling and its exponential decay coefficient. © 2010 American Institute of Physics.
Persistent Identifierhttp://hdl.handle.net/10722/141694
ISSN
0003-6951
2023 Impact Factor: 3.5
2023 SCImago Journal Rankings: 0.976
ISI Accession Number ID
WOS:000284545200067
Funding AgencyGrant Number
Air Force Office of Scientific ResearchFA9550-06-1-0399
U.S. Department of Energy, Office of Science, Office of Basic Energy SciencesDE-SC0000957
Funding Information:

The experimental component of this work was supported by the Air Force Office of Scientific Research under Award No. FA9550-06-1-0399, and the theoretical component was supported as part of the Center for Solar and Thermal Energy Conversion, an Energy Frontier Research Center funded by the U.S. Department of Energy, Office of Science, Office of Basic Energy Sciences under Award No. DE-SC0000957.

References
References in Scopus

 

DC FieldValueLanguage
dc.contributor.authorYadav, Aen_HK
dc.contributor.authorJin, Yen_HK
dc.contributor.authorChan, PKLen_HK
dc.contributor.authorShtein, Men_HK
dc.contributor.authorPipe, KPen_HK
dc.date.accessioned2011-09-27T02:58:15Z-
dc.date.available2011-09-27T02:58:15Z-
dc.date.issued2010en_HK
dc.identifier.citationApplied Physics Letters, 2010, v. 97 n. 20, article no. 203307-
dc.identifier.issn0003-6951en_HK
dc.identifier.urihttp://hdl.handle.net/10722/141694-
dc.description.abstractTemperature modulation spectroscopy is used to obtain the temperature dependences of oscillator strength, exciton transition energy, and linewidth for a copper phthalocyanine thin film. With increasing temperature, the oscillator strength exhibits a pronounced decrease for charge transfer (CT) excitons, making this technique suitable for differentiating exciton types. From the measured magnitude and temperature dependence of the CT oscillator strength, we obtain estimates for the intermolecular electronic coupling and its exponential decay coefficient. © 2010 American Institute of Physics.en_HK
dc.languageengen_US
dc.publisherAmerican Institute of Physics. The Journal's web site is located at http://apl.aip.org/en_HK
dc.relation.ispartofApplied Physics Lettersen_HK
dc.subjectCharge Transferen_US
dc.subjectDecay (Organic)en_US
dc.subjectExcitonsen_US
dc.subjectIon Exchangeen_US
dc.subjectMolecular Spectroscopyen_US
dc.subjectTemperature Distributionen_US
dc.subjectThin Filmsen_US
dc.titleIntermolecular electronic coupling in organic molecular thin films measured by temperature modulation spectroscopyen_HK
dc.typeArticleen_HK
dc.identifier.emailChan, PKL:pklc@hku.hken_HK
dc.identifier.authorityChan, PKL=rp01532en_HK
dc.description.naturelink_to_subscribed_fulltexten_US
dc.identifier.doi10.1063/1.3516040en_HK
dc.identifier.scopuseid_2-s2.0-78649291121en_HK
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-78649291121&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.volume97en_HK
dc.identifier.issue20en_HK
dc.identifier.spagearticle no. 203307-
dc.identifier.epagearticle no. 203307-
dc.identifier.isiWOS:000284545200067-
dc.publisher.placeUnited Statesen_HK
dc.identifier.scopusauthoridYadav, A=26424844500en_HK
dc.identifier.scopusauthoridJin, Y=7404458547en_HK
dc.identifier.scopusauthoridChan, PKL=35742829700en_HK
dc.identifier.scopusauthoridShtein, M=7003903633en_HK
dc.identifier.scopusauthoridPipe, KP=6603768450en_HK
dc.identifier.issnl0003-6951-

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