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Conference Paper: Characterization of evaporated solid-phase crystallized silicon thin-film solar cells on glass

TitleCharacterization of evaporated solid-phase crystallized silicon thin-film solar cells on glass
Authors
KeywordsCurrent-voltage measurements
Device performance
Eva solar cells
External quantum efficiency
Impurity level
Issue Date2009
PublisherIEEE.
Citation
The 34th IEEE Conference on Photovoltaic Specialists (PVSC 2009), Philadelphia, PA., 7-12 June 2009. In Conference Record, 2009, p. 000445-000449 How to Cite?
AbstractFollowing our previous study on the material-quality limiting factors of evaporated solid-phase crystallized (SPC) poly-Si thin films fabricated on planar glass for photovoltaic applications, we extend our study to investigate the impurity levels, optical properties, transport properties, and device performance of so-called "EVA" (EVAporated Si) solar cells. These potentially cost-effective cells are systematically characterized with electron microscopy-based techniques, external quantum efficiency, and standard current-voltage measurements. We conclude that 5% efficient cells are now attainable, and much room remains for further improving device performance. We are confident that 10%-efficient EVA solar cells will be realized in the future, with proper metallization schemes, good light trapping, and improved poly-Si film quality. ©2009 IEEE.
Persistent Identifierhttp://hdl.handle.net/10722/140352
ISSN
References

 

DC FieldValueLanguage
dc.contributor.authorLiu, Fen_HK
dc.contributor.authorRomero, MJen_HK
dc.contributor.authorJones, KMen_HK
dc.contributor.authorKunz, Oen_HK
dc.contributor.authorWong, Jen_HK
dc.contributor.authorReedy, RCen_HK
dc.contributor.authorAberle, AGen_HK
dc.contributor.authorAlJassim, MMen_HK
dc.date.accessioned2011-09-23T06:10:36Z-
dc.date.available2011-09-23T06:10:36Z-
dc.date.issued2009en_HK
dc.identifier.citationThe 34th IEEE Conference on Photovoltaic Specialists (PVSC 2009), Philadelphia, PA., 7-12 June 2009. In Conference Record, 2009, p. 000445-000449en_HK
dc.identifier.issn0160-8371en_HK
dc.identifier.urihttp://hdl.handle.net/10722/140352-
dc.description.abstractFollowing our previous study on the material-quality limiting factors of evaporated solid-phase crystallized (SPC) poly-Si thin films fabricated on planar glass for photovoltaic applications, we extend our study to investigate the impurity levels, optical properties, transport properties, and device performance of so-called "EVA" (EVAporated Si) solar cells. These potentially cost-effective cells are systematically characterized with electron microscopy-based techniques, external quantum efficiency, and standard current-voltage measurements. We conclude that 5% efficient cells are now attainable, and much room remains for further improving device performance. We are confident that 10%-efficient EVA solar cells will be realized in the future, with proper metallization schemes, good light trapping, and improved poly-Si film quality. ©2009 IEEE.en_HK
dc.languageengen_US
dc.publisherIEEE.-
dc.relation.ispartofIEEE Photovoltaic Specialists Conference. Conference Recorden_HK
dc.rightsCreative Commons: Attribution 3.0 Hong Kong License-
dc.rightsIEEE Photovoltaic Specialists Conference. Conference Record. Copyright © IEEE.-
dc.rights©2009 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.-
dc.subjectCurrent-voltage measurements-
dc.subjectDevice performance-
dc.subjectEva solar cells-
dc.subjectExternal quantum efficiency-
dc.subjectImpurity level-
dc.titleCharacterization of evaporated solid-phase crystallized silicon thin-film solar cells on glassen_HK
dc.typeConference_Paperen_HK
dc.identifier.emailLiu, F:fordliu@hku.hken_HK
dc.identifier.authorityLiu, F=rp01358en_HK
dc.description.naturepublished_or_final_version-
dc.identifier.doi10.1109/PVSC.2009.5411644en_HK
dc.identifier.scopuseid_2-s2.0-77951540348en_HK
dc.identifier.hkuros194609en_US
dc.relation.referenceshttp://www.scopus.com/mlt/select.url?eid=2-s2.0-77951540348&selection=ref&src=s&origin=recordpageen_HK
dc.identifier.spage000445en_HK
dc.identifier.epage000449en_HK
dc.publisher.placeUnited Statesen_HK
dc.description.otherThe 34th IEEE Conference on Photovoltaic Specialists (PVSC 2009), Philadelphia, PA., 7-12 June 2009. In Conference Record, 2009, p. 000445-000449-
dc.identifier.scopusauthoridLiu, F=11038795100en_HK
dc.identifier.scopusauthoridRomero, MJ=7202431518en_HK
dc.identifier.scopusauthoridJones, KM=24321208800en_HK
dc.identifier.scopusauthoridKunz, O=23990733000en_HK
dc.identifier.scopusauthoridWong, J=7404431480en_HK
dc.identifier.scopusauthoridReedy, RC=35335059900en_HK
dc.identifier.scopusauthoridAberle, AG=7006162095en_HK
dc.identifier.scopusauthoridAlJassim, MM=7005692042en_HK

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